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124 条记录 (耗时 0.026 秒)

    SINGLE SPIN NMR MEASUREMENT SYSTEMS AND METHODS
    1.
    发明申请
    SINGLE SPIN NMR MEASUREMENT SYSTEMS AND METHODS 审中-公开

    公开(公告)号：WO2022180631A1

    公开(公告)日：2022-09-01

    申请号：PCT/IL2022/050212

    申请日：2022-02-23

    申请人： B. G. NEGEV TECHNOLOGIES AND APPLICATIONS LTD.

    发明人： MANASSEN, Yishay

    IPC分类号： G01N24/10 ,  B82Y35/00 ,  G01N24/08 ,  G01Q60/12 ,  G01R33/20 ,  G01R33/28 ,  G01R33/32 ,  G01R33/60

    摘要： Detection of spin nucleus resonance (NMR) precession signal/peak of at least one atom or molecule of a sample material placed on a sample electrode while a static uniform magnetic field of a determined strength is induced through it is achieved by applying an alternating bias voltage to a tunneling tip in a frequency at least greater than an NMR frequency range and smaller than a hyperfine electron spin resonance (ESR) frequency range for alternatingly changing within each cycle of the alternating bias voltage at least one atom or molecule of a sample material between diamagnetic and paramagnetic states, and analysing a measured electrical tunneling current passing through the sample electrode. A plurality of hyperfine ESR signals/peaks are identified in the measured electrical tunneling current, each of which associated with a respective cycle of the alternating bias voltage, and a respective hyperfine ESR frequency thereof is determined. At least one single spin NMR precession signal/peak is identified based on changes in the plurality of hyperfine ESR signals/peaks.

    SENSING SYSTEM
    4.
    发明申请
    SENSING SYSTEM 审中-公开

    公开(公告)号：WO2019090426A1

    公开(公告)日：2019-05-16

    申请号：PCT/CA2018/051412

    申请日：2018-11-08

    申请人： SHIMCO NORTH AMERICA INC.

    发明人： BAN, Dayan ,  VOSS, Peter Michael

    IPC分类号： G01D5/00 ,  B64F5/60 ,  B82Y35/00 ,  F03G7/08 ,  F16B31/02 ,  F16B43/00 ,  G01B21/32 ,  G01B7/16 ,  G06F7/00

    摘要： The present invention relates to a sensing system that, in a preferred embodiment, can be readily integrated into load-lifting structures (such as wings and landing gears) to provide real-time DPHM and obviate/mitigate catastrophic problems. Broadly, the present sensing system combines at least one shim portion with at least one nanogenerator such as a TENG or a PENG. A major advantage of the present sensing system is that it combines in a single structure the following functions: (a) gap management in the component in which the sensing system is installed, (b) collection/storage of measured data for the component in which the sensing system is installed, (c) harvesting/storing energy from operation environment of the component in which the sensing system is installed (e.g., DPHM data when the present sensing system is used for assessment of an aircraft's structural conditions), and (d) wireless transmission of measured data for the component in which the sensing system is installed to a user interface.

    検出装置及び検出方法
    5.
    发明申请
    検出装置及び検出方法 审中-公开

    公开(公告)号：WO2019059171A1

    公开(公告)日：2019-03-28

    申请号：PCT/JP2018/034425

    申请日：2018-09-18

    申请人： パナソニックIPマネジメント株式会社

    发明人： 柳川　博人 ,  塩井　正彦 ,  西尾　和晃 ,  池内　江美奈

    IPC分类号： G01N21/64 ,  B82Y15/00 ,  B82Y35/00 ,  G01N21/41 ,  G01N33/543

    摘要： 本開示は、低濃度の被検出物質を高感度に検出することができる検出装置を提供する。本開示による検出装置は、被検出物質に特異的に結合する性質を有する第１のＶＨＨ抗体（２０４５）が固定され、励起光が照射されることによって表面プラズモンを生じさせる金属微細構造体（２０４１）と、被検出物質（２０６２）と特異的に結合する性質を有し、蛍光物質（２０６４）で標識された第２のＶＨＨ抗体（２０６３）、及び被検出物質（２０６２）を含み得る試料を、金属微細構造体（２０４１）に導入する導入口と、第２のＶＨＨ抗体（２０６３）及び試料が導入された金属微細構造体（２０４１）に、励起光を照射する光源と、励起光の照射により蛍光物質（２０６４）から生じる蛍光に基づき、被検出物質（２０６２）を検出する検出部と、を備える。

    A COMMON-PATH INTERFEROMETRIC SCATTERING IMAGING SYSTEM AND A METHOD OF USING COMMON-PATH INTERFEROMETRIC SCATTERING IMAGING TO DETECT AN OBJECT
    6.
    发明申请
    A COMMON-PATH INTERFEROMETRIC SCATTERING IMAGING SYSTEM AND A METHOD OF USING COMMON-PATH INTERFEROMETRIC SCATTERING IMAGING TO DETECT AN OBJECT 审中-公开
    一种公用路径干涉散射成像系统及一种利用公共路径干涉测量成像检测物体的方法

    公开(公告)号：WO2018019934A1

    公开(公告)日：2018-02-01

    申请号：PCT/EP2017/068997

    申请日：2017-07-27

    申请人： FUNDACIÓ INSTITUT DE CIÈNCIES FOTÒNIQUES ,  INSTITUCIÓ CATALANA DE RECERCA I ESTUDIS AVANCATS

    发明人： LIEBEL, Matz ,  HUGALL, James Tom ,  VAN HULST, Niek F.

    IPC分类号： G02B21/14 ,  G01N21/45 ,  G01N15/02 ,  B82Y35/00

    CPC分类号： G01N15/1434 ,  G01N15/0227 ,  G01N15/1429 ,  G01N21/45 ,  G01N21/4795 ,  G01N2015/0038 ,  G01N2015/0238 ,  G01N2015/1006 ,  G01N2015/1454 ,  G01N2015/1493 ,  G02B21/14

    摘要： The present invention relates to a common-path interferometric scattering imaging system and a method of using such a system, where the system comprises: - illuminating means for emitting an illumination beam (L 0 ); - light collecting means for collecting through a common collection optical path: - a scattered beam (L s ) provided by the light scattering on an object (T) of the illumination beam (L 0 ); and - a reference beam (L r ) provided by the reflection on or transmission through an interface (I) of the illumination beam (L 0 ); - image sensing means (D) for receiving and sensing the collected scattered (L s ) and reference (L r ) beams interfering thereon as an interferometric light signal; - attenuation means arranged in the common collection optical path for attenuating the reference beam (L r ) before it arrives at the image sensing means (D); and - processing means (P) to process data corresponding to the interferometric light signal.

    摘要翻译： 本发明涉及共路干涉式散射成像系统和使用这种系统的方法，其中该系统包括： - 照明装置，用于发射照明光束（L0 <0） /子>）; - 光收集装置，用于通过公共收集光路收集： - 由散射在照明光束（L 0）上的物体（T）上的光提供的散射光束（L s） /子>）; 和 - 通过在照明光束（L0）的界面（I）上的反射或透射而提供的参考光束（Lr）。 - 图像感测装置（D），用于接收和感测在其上干涉的收集的散射（L s）和参考（L r）光束作为干涉光信号; - 设置在公共收集光路中的衰减装置，用于在参考光束（Lr）到达图像传感装置（D）之前衰减参考光束（Lr）。 和 - 处理装置（P），用于处理对应于干涉光信号的数据。

    SIGNAL AMPLIFICATION IN SOLUTION-BASED PLASMONIC SPECIFIC-BINDING PARTNER ASSAYS
    9.
    发明申请
    SIGNAL AMPLIFICATION IN SOLUTION-BASED PLASMONIC SPECIFIC-BINDING PARTNER ASSAYS 审中-公开
    基于解决方案的信号特定绑定合作伙伴测试中的信号放大

    公开(公告)号：WO2017024163A1

    公开(公告)日：2017-02-09

    申请号：PCT/US2016/045606

    申请日：2016-08-04

    申请人： ABAXIS, INC. ,  FRISZ, Jessica

    发明人： FRISZ, Jessica ,  MEHRA, Rajesh K. ,  ARON, Kenneth P. ,  CHIANG, Vincent

    IPC分类号： B82Y30/00 ,  B82Y35/00 ,  G01N21/17 ,  G01N21/55

    CPC分类号： G01N33/553 ,  G01N33/54373 ,  G01N2469/10 ,  Y02A50/57

    摘要： The present invention relates to analyte detection devices and methods of using such devices to detect minute quantities of a target analyte in a sample. In particular, the invention provides a method of detecting a target analyte in a sample comprising mixing the sample with a first detection conjugate and a second detection conjugate in solution, wherein the first and second detection conjugates comprise metallic nanostructures coupled to binding partners that are capable of specifically binding to the target analyte if present in the sample to form a complex between the first detection conjugate, the analyte, and the second detection conjugate, wherein a change in an optical signal upon complex formation indicates the presence of the target analyte in the sample. Methods of preparing nanostructures and nanoalloys, as well as nanostructures and nanoalloys conjugated to binding partners, are also described.

    摘要翻译： 本发明涉及分析物检测装置和使用这种装置来检测样品中微量的目标分析物的方法。 特别地，本发明提供了一种检测样品中的目标分析物的方法，包括将样品与溶液中的第一检测缀合物和第二检测缀合物混合，其中第一和第二检测缀合物包含与结合配偶体偶联的金属纳米结构， 如果存在于样品中以形成第一检测缀合物，分析物和第二检测缀合物之间的复合物，则特异性结合目标分析物，其中复合物形成时光信号的变化表明靶分析物在 样品。 还描述了制备纳米结构和纳米合金以及与结合配偶体缀合的纳米结构和纳米合金的方法。

    SAMPLE HOLDER FOR AN ATOMIC FORCE MICROSCOPE
    10.
    发明申请
    SAMPLE HOLDER FOR AN ATOMIC FORCE MICROSCOPE 审中-公开
    原子力显微镜样品座

    公开(公告)号：WO2015001119A1

    公开(公告)日：2015-01-08

    申请号：PCT/EP2014/064389

    申请日：2014-07-05

    申请人： UNIVERSITÄT BASEL

    发明人： LOPARIC, Marko ,  OEHLER, Pascal Alexander

    IPC分类号： G01Q30/20 ,  A61B10/02 ,  B82Y35/00

    CPC分类号： G01Q30/20 ,  A61B10/0233 ,  G01Q60/24

    摘要： The present invention relates to sample holders for holding a sample, particularly for an atomic force microscope. Such a sample holder comprising a sample dish (1) comprising a bottom (2), and an opening (3) arranged in said bottom (2) for receiving and holding the sample (15). Furthermore the present invention relates to a sample holder system and to a method for transferring an e.g. biological sample (15) from a biopsy tool (18) to a sample holder.

    摘要翻译： 本发明涉及用于保持样品的样品保持器，特别是用于原子力显微镜。 这种样品保持器包括包括底部（2）的样品皿（1）和布置在所述底部（2）中用于接收和保持样品（15）的开口（3）。 此外，本发明涉及一种样品保持器系统和一种用于转移例如， 生物样品（15）从活检工具（18）到样品架。