ACTIVE PROBE FOR AN ATOMIC FORCE MICROSCOPE AND METHOD OF USE THEREOF
    1.
    发明申请
    ACTIVE PROBE FOR AN ATOMIC FORCE MICROSCOPE AND METHOD OF USE THEREOF 审中-公开
    用于原子力显微镜的主动探测器及其使用方法

    公开(公告)号:WO0058759A3

    公开(公告)日:2001-07-12

    申请号:PCT/US0005450

    申请日:2000-03-03

    Abstract: An AFM (10) that combines an AFM Z position actuator (16) and a self-actuated Z-position cantilever (20) (both operable in cyclical mode and contact mode), with appropriate nested feedback control circuitry to achieve high-speed imaging and accurate Z-position measurements. The self-actuated cantilever (20) includes a Z-positioning element (36) integrated therewith and an oscillator that oscillates the cantilever (20) at a resonant frequency and at an oscillation amplitude equal to a setpoint value. The AFM includes a first feedback circuit (12) nested within a second feedback circuit (14), wherein the first feedback circuit generates a cantilever control signal in response to vertical displacement of the self-actuated cantilever (20) during a scanning operation, and the second feedback circuit (14) is responsive to the cantilever control signal to generate a position control signal.

    Abstract translation: AFM(10)组合了AFM Z位置执行器(16)和自动Z位置悬臂(20)(均可在循环模式和接触模式下操作)与适当的嵌套反馈控制电路实现高速成像 和精确的Z位置测量。 自动驱动悬臂(20)包括与其成一体的Z定位元件(36)和振荡器,其以共振频率和等于设定值的振荡振幅振荡悬臂(20)。 AFM包括嵌套在第二反馈电路(14)内的第一反馈电路(12),其中第一反馈电路在扫描操作期间响应于自致动悬臂(20)的垂直位移而产生悬臂控制信号,以及 第二反馈电路(14)响应于悬臂控制信号以产生位置控制信号。

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