FORCE SCANNING PROBE MICROSCOPE
    3.
    发明申请
    FORCE SCANNING PROBE MICROSCOPE 审中-公开
    强力扫描探针显微镜

    公开(公告)号:WO2003050821A1

    公开(公告)日:2003-06-19

    申请号:PCT/US2002/039012

    申请日:2002-12-06

    Abstract: A force scanning probe microscope, i.e. an FSPM (100) and associated method of making force measurements on a sample (116) includes a piezoelectric scanner (118) have a surface that supports sample (116) so as to move the sample (116) in three orthogonal directions. FSPM (100) also includes a displacement sensor (162) that measures movement of the sample (116) in a direction orthogonal to the surface and generates a corresponding position signal so as to provide closed loop position feedback. In addition, a probe (108) is fixed relative to the piezoelectric scanner (118), while a deflection detection apparatus (123) is employed to sense deflection of probe (108). FSPM also includes a controller (128) that generates a scanner drive signal based on the position signal, and is adapted to operate according to a user-defined input that can change a force curve measurement parameter during data acquisition.

    Abstract translation: 强力扫描探针显微镜,即FSPM(100)和在样品(116)上进行力测量的相关方法包括具有支撑样品(116)的表面以便移动样品(116)的压电扫描仪(118) 在三个正交方向。 FSPM(100)还包括位移传感器(162),该位移传感器测量样品(116)在与该表面正交的方向上的移动,并产生相应的位置信号,从而提供闭环位置反馈。 此外,探针(108)相对于压电扫描器(118)固定,而偏转检测装置(123)用于检测探针(108)的偏转。 FSPM还包括基于位置信号产生扫描仪驱动信号的控制器(128),并且适于根据在数据采集期间可以改变力曲线测量参数的用户定义的输入进行操作。

    INSTRUMENT FOR MEASURING AND CLASSIFYING NANOMETER AEROSOLS
    5.
    发明申请
    INSTRUMENT FOR MEASURING AND CLASSIFYING NANOMETER AEROSOLS 审中-公开
    用于测量和分类NANOMETER AEROSOLS的仪器

    公开(公告)号:WO99041585A2

    公开(公告)日:1999-08-19

    申请号:PCT/US1999/002971

    申请日:1999-02-12

    Abstract: An apparatus for classifying polydisperse aerosols includes aerosol and sheath gas conduits for conducting a sample aerosol and a sheath gas toward a merger area. At the merger area the sheath gas and about ten percent of the sample aerosol merge, then travel through a differential mobility analyzer (DMA) and along a tubular electrode of the DMA. Selected particles, i.e. particles having electrical mobilities within a narrow range, pass through a collection aperture of the electrode. The DMA output, an aerosol consisting of the selected particles, is provided to a condensation particle counter or other device for determining the aerosol concentration. The remainder of the sample aerosol is conducted away from the merger area along a bypass flow conduit. The bypass flow and an improved aerodynamic design provide for a slit at the merger area that is sufficiently narrow to minimize unwanted electric field penetration at the slit and DMA entrance. An annular flow restriction feature in the bypass conduit promotes and maintains laminar, uniform-velocity flow near the slit. The collection aperture is located medially along the tubular electrode, to prevent electrical field fringing near the aperture.

    Abstract translation: 用于分类多分散气溶胶的装置包括用于将样品气溶胶和护套气体导向合并区域的气溶胶和鞘气导管。 在合并区域,护套气体和约10%的样品气溶胶合并,然后通过差示迁移率分析仪(DMA)和DMA的管状电极行进。 所选择的粒子,即具有窄范围内的电迁移率的粒子通过电极的收集孔。 将DMA输出(由所选颗粒组成的气溶胶)提供给冷凝颗粒计数器或用于确定气溶胶浓度的其它装置。 样品气溶胶的其余部分沿旁路流动导管远离合并区域。 旁路流动和改进的空气动力学设计为合并区域的狭缝提供足够窄的狭缝,以最小化狭缝和DMA入口处的不需要的电场穿透。 旁通管道中的环形流动限制特征促进并维持狭缝附近的层流均匀的流速。 收集孔沿着管状电极向内定位,以防止孔附近的电场边缘。

    MICROSCOPE FOR COMPLIANCE MEASUREMENT
    6.
    发明申请
    MICROSCOPE FOR COMPLIANCE MEASUREMENT 审中-公开
    MICROSCOPE符合性测量

    公开(公告)号:WO99006793A1

    公开(公告)日:1999-02-11

    申请号:PCT/US1998/015498

    申请日:1998-07-27

    Abstract: An atomic force microscope and method of operation are provided and include a force sensing probe tip (48) adapted to be brought into close proximity with a sample surface (52), a scanning element (50) for generating relative movement between the probe tip and the sample surface, a device (62) for generating a magnetic field to cause deflection of the probe tip, a driver (73) for the device, the driver including a source of alternating current (66) and a source of a second current (74) of a controlled magnitude, and a detector (60) for detecting the position of the probe tip. In a preferred mode of operation, two signals, one of alternating current and the other of a fixed, but variable, current, are applied to cause a displacement of the time-average position of the probe tip.

    Abstract translation: 提供了一种原子力显微镜和操作方法,包括适于与样品表面(52)紧密接近的力传感探针尖端(48),用于产生探头尖端和 所述样品表面,用于产生磁场以引起所述探针尖端偏转的装置(62),用于所述装置的驱动器(73),所述驱动器包括交流电流源(66)和第二电流源( 74)和用于检测探针尖端的位置的检测器(60)。 在优选的操作模式中,施加两个信号,一个交流电流,另一个是固定的,但是可变电流,以引起探头尖端的时间平均位置的位移。

    INSTALLATION FOR THE STUDY OR TRANSFORMATION OF SAMPLE SURFACES IN A VACUUM OR CONTROLLED ATMOSPHERE
    8.
    发明申请
    INSTALLATION FOR THE STUDY OR TRANSFORMATION OF SAMPLE SURFACES IN A VACUUM OR CONTROLLED ATMOSPHERE 审中-公开
    安装在真空或控制的大气中的样品表面的研究或转换

    公开(公告)号:WO1991017429A1

    公开(公告)日:1991-11-14

    申请号:PCT/FR1991000378

    申请日:1991-05-07

    Abstract: An installation for the study of the surface of samples in a vacuum or controlled atmosphere, of the type comprising a main chamber in which is placed a microscopy stage support for at least one device, known as SXM, for microscopy, spectroscopy or engraving a sample surface, according to a process for carrying out the scanning of said surface using an electrically or light conducting microprobe, said installation being characterized in that the stage support can be disconnected from the main chamber and rotated around a central axis in order for an assembly of SXM devices arranged on the periphery of said stage to be used. The invention is applicable, in particular, to electron scanning tunnelling microscopy and/or spectroscopy, especially in ultrahigh vacuums, optic scanning tunnelling microscopy and/or spectroscopy, or to the engraving of nanometric structures using microlithographic optic and/or electronic processes.

    Abstract translation: PCT No.PCT / FR91 / 00378 Sec。 371日期:1993年1月5日 102(e)日期1993年1月5日PCT提交1991年5月7日PCT公布。 公开号WO91 / 17429 日期为1991年11月14日。用于分析或转化放置在真空或受控气氛中的样品表面的装置,包括主壳体,其中定位有至少一个称为SXM的装置的支撑板,其中, 例如光或电导电尖端定位为接近待检测样品的表面,无论是在空气中还是在真空中。 该器件旨在通过微探针扫描表面进行显微镜,光谱或样品表面的蚀刻。 支撑板配备有用于将其与主壳体断开的元件以及用于使支撑板围绕中心轴线旋转的元件,允许使用装配在支撑板的周边中的一系列SXM装置。 主外壳由用于样品表面的洗涤外壳和样品的引入和储存外壳完成,样品可以通过传送杆端部的安装进行处理,该输送杆可纵向移动并沿轴向旋转 外壳的对齐轴。

    MULTU-FUNCTIONAL PROTECTIVE TEXTILES AND METHODS FOR DECONTAMINATION
    10.
    发明申请
    MULTU-FUNCTIONAL PROTECTIVE TEXTILES AND METHODS FOR DECONTAMINATION 审中-公开
    微生物功能性保护性纺织品及其去除方法

    公开(公告)号:WO2004039187A2

    公开(公告)日:2004-05-13

    申请号:PCT/US2003/005177

    申请日:2003-02-21

    IPC: A41D

    Abstract: A reactive and adsorptive (i.e., multi -functional protective) textile and methods for constructing and using same which possess at least chemically reactive and biocidal properties. Nanoparticles from different classes such as metal oxides, metal hydroxides, metal hydrates and POMs are incorporated into elements which can be utilized in a wide variety of protective materials. The nanoparticles may be treated to reduce water solubility or combined with halogens, alkali metals or secondary metal oxides to specifically engineer the nanoparticle to address a particular chemical or biocidal threat. In one aspect, a protective spatially-distributed biocidal interface is provided comprising a textile having interior structures, wherein protective nanoparticles bonded to said interior structures such that an article or portions of an article which are maintained in proximity to the textile are permitted to safely pass through a contaminated environment without dispersing the nanoparticles from protective proximity to the article.

    Abstract translation: 具有至少具有化学反应性和杀生物性的反应性和吸附性(即多功能保护性)织物及其构造和使用方法。 来自不同类别的纳米颗粒如金属氧化物,金属氢氧化物,金属水合物和POM被并入可用于各种保护材料的元素中。 可以处理纳米颗粒以降低水溶性或与卤素,碱金属或二次金属氧化物组合以特异性地设计纳米颗粒以解决特定的化学或杀生物的威胁。 在一个方面,提供了保护性空间分布的杀生物界面,其包括具有内部结构的织物,其中保护性纳米颗粒结合到所述内部结构,使得保持在纺织品附近的制品或制品的一部分被允许安全地通过 通过污染的环境,而不会使纳米颗粒与物品保持接近。

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