Abstract:
Memory system configured to perform write assist, the memory system including: a first head switch, a second head switch and a plurality of memory control circuits, each having: a first column selection switch, the first head switch being coupled between a memory supply voltage rail and the first column selection switch, wherein the first column selection switch is coupled between the first head switch and a supply voltage node for a respective column of a memory; a second column selection switch coupled between the supply voltage node and an electric ground; and a core power lowering (CPL) switch. The second head switch is coupled between the memory supply voltage rail and the CPL switches. The first and second head switches are directly coupled between the memory supply voltage rail and respective voltage rail nodes which are common to all memory control circuits in the plurality of memory control circuits.
Abstract:
A memory is provided that includes a negative bit line boost circuit for boosting a discharged bit line to a negative voltage during a negative bit line boost period for a write operation to a selected column in the memory. The memory also includes a core voltage control circuit configured to float a core power supply voltage for the selected column during the negative bit line boost period.
Abstract:
A memory and method of performing a write operation in a memory are disclosed. In one aspect of the disclosure, the memory includes a memory cell, a pair of bit lines (BL; BLB) coupled to the memory cell, a multiplexer (404), and a pull-up circuit (418) coupled to the multiplexer. The multiplexer may be configured to select the pair of bit lines coupled to the memory cell during the write operation. To increase the write performance of the memory cell, the pull-up circuit is configured to select which of the pair of bit lines is a non¬ zero bit line during the write operation and to clamp the non-zero bit line through read pass transistors (rpO, rpbO) of the multiplexer to approximately a power rail voltage (VDD). Thus, the pull-up circuit (418) may increase the voltage difference between the non-zero bit line and the zero bit line during the write operation and thus decrease the area and power consumed by a boost capacitance of a conventional write driver.
Abstract:
A multi-port memory is provided that supports collision between a read port and a write port to the same multi-port bitcell. A sense amplifier reads a data bit from a multi-port bitcell when a write port to the multi-port bitcell is addressed during a system clock signal. Should a read port to the multi-port bitcell be addressed during the same system clock signal, a multiplexer selects for an output bit from the sense amplifier.
Abstract:
Apparatuses and methods to reduce leakage current are presented. The apparatus includes a switch circuit configured to power a circuit block; a delay circuit configured to delay enabling the switch circuit powering the circuit block and to be powered down; and a bypass circuit configured to bypass the delay circuit to disable the switch circuit powering the circuit block. The method includes powering, by a switch, a circuit block; powering down a delay circuit; and bypassing, by a bypass circuit, the delay circuit to disable the switch circuit powering the circuit block.
Abstract:
A negative bit line boost circuit for a memory is configured to control a write multiplexer and a write assist transistor so that charge from a boost capacitor positively charges a bit line following a write assist period.
Abstract:
A memory is provided in which a scan chain covers the redundancy logic for column redundancy as well as the redundancy multiplexers in each column. The redundancy logic includes a plurality of redundancy logic circuits arranged in series. Each redundancy logic circuit corresponds to a respective column in the memory. Each column is configured to route a shift-in signal through its redundancy multiplexers during a scan mode of operation.
Abstract:
A first bitline driver includes a multiplexer for outputting data and write mask signals in functional mode, and test vector signal in test mode; a latch to latch the data signal in functional mode and the test vector signal in test mode; a latch to latch the write mask signal in functional mode and the test vector signal in test mode; a latch to latch the test vector signal and provide it to a scan output; and a write circuit for writing data to a memory cell based on the data signal. A second bitline driver includes a latch to latch a data signal in functional mode if a write mask signal is deasserted and to latch a test vector signal in test mode; a latch to latch the test vector signal and provide it to a scan output; and a write circuit for writing data to a memory cell.
Abstract:
In an aspect of the disclosure, an apparatus is provided. In one aspect, the apparatus is a memory apparatus. The memory apparatus includes a memory. The memory includes first and second bitcell arrays. The memory apparatus also includes a sense amplifier. The sense amplifier is shared by the first and the second bitcell arrays. Additionally, the sense amplifier is configured to amplify data stored in the memory during a read operation. The memory apparatus also includes a write circuit. The write circuit is configured to write data to the memory during a write operation. The memory apparatus also includes a controller. The controller is configured to disable the write circuit during the read operation.
Abstract:
A memory and a method for operating a memory are provided. The memory includes a memory cell having a transistor and a wordline driver outputting a wordline coupled to the memory cell. The wordline driver adjusts a voltage level of the wordline to compensate for a parameter of the transistor. The method includes asserting a wordline voltage to access a memory cell having a transistor and adjusting the wordline voltage to compensate for a parameter of the transistor. Another memory is provided. The memory includes a memory cell and a wordline driver outputting a wordline coupled to the memory cell. The wordline driver adjusts a voltage level of the wordline based on a feedback of the wordline.