Abstract:
A storage control system and method of operation thereof includes: a memory circuit for accessing a configuration category; a configuration module, coupled to the memory circuit, for configuring the memory circuit with the configuration category; and an operation module, coupled to the configuration module, for controlling a performance characteristic of a memory device based on the configuration category.
Abstract:
Systems, methods and/or devices are used to enable dynamic erase block grouping. In one aspect, the method includes (1) maintaining metadata for each erase block of a plurality of erase blocks in a data storage system, wherein a respective metadata for a respective erase block includes one or more characteristics of the respective erase block, (2) allocating a set of erase blocks, of the plurality of erase blocks, as unassociated erase blocks, (3) selecting two or more unassociated erase blocks in accordance with characteristics of the unassociated erase blocks so as to select unassociated erase blocks with similar characteristics, and (4) grouping the two or more unassociated erase blocks with similar characteristics to form a super block.
Abstract:
A storage control system, and a method of operation thereof, including: a power-down module for powering off a memory sub-system; a decay estimation module, coupled to the power-down module, for estimating a power-off decay rate upon the memory sub-system powered up, the power-off decay rate is for indicating how much data in the memory sub-system has decayed while the memory sub-system has been powered down; and a recycle module, coupled to the decay estimation module, for recycling an erase block for data retention based on the power-off decay rate.
Abstract:
Systems, methods and/or devices are used to enable a settings adjustment mechanism. In one aspect, the method includes (1) accessing characterization information corresponding to how a group of non-volatile memory devices of a storage control system operates as the group wears, (2) determining an estimated age of a non-volatile memory device, of the group of non-volatile memory devices, in accordance with a wear indicator for the non-volatile memory device, and (3) determining one or more settings for the non-volatile memory device in accordance with the estimated age and the characterization information.