Abstract:
Systems, methods and/or devices are used to enable dynamic erase block grouping. In one aspect, the method includes (1) maintaining metadata for each erase block of a plurality of erase blocks in a data storage system, wherein a respective metadata for a respective erase block includes one or more characteristics of the respective erase block, (2) allocating a set of erase blocks, of the plurality of erase blocks, as unassociated erase blocks, (3) selecting two or more unassociated erase blocks in accordance with characteristics of the unassociated erase blocks so as to select unassociated erase blocks with similar characteristics, and (4) grouping the two or more unassociated erase blocks with similar characteristics to form a super block.
Abstract:
A storage control system, and a method of operation thereof, including: a power-down module for powering off a memory sub-system; a decay estimation module, coupled to the power-down module, for estimating a power-off decay rate upon the memory sub-system powered up, the power-off decay rate is for indicating how much data in the memory sub-system has decayed while the memory sub-system has been powered down; and a recycle module, coupled to the decay estimation module, for recycling an erase block for data retention based on the power-off decay rate.
Abstract:
A test system (100), and a method of manufacture thereof, including: a thermal management head (402) including a heat spreader (206); an electronic device (210) in direct contact with the heat spreader (206); and an electrical current for transferring energy between the heat spreader (206) and the electronic device (210).
Abstract:
A method of operation of a storage control system includes: generating encoded data having a proportional data distribution for writing to a memory device; identifying a marginal block when an erase block is read from the memory device; and generating a marginal tag for the marginal block, the marginal tag having a non-proportional data distribution different from the proportional data distribution.
Abstract:
A method of operation of a storage control system includes: calculating a throttle threshold; identifying a detection point based on the throttle threshold; and calculating a number of write/erase cycles based on the detection point and the throttle threshold for writing a memory device.
Abstract:
A storage control system and method of operation thereof includes: a memory circuit for accessing a configuration category; a configuration module, coupled to the memory circuit, for configuring the memory circuit with the configuration category; and an operation module, coupled to the configuration module, for controlling a performance characteristic of a memory device based on the configuration category.
Abstract:
An electronic system, and a method of manufacture thereof, including: a substrate; an electrical device over the substrate; and a surface mount heat sink next to the electrical device, the surface mount heat sink having an extruded shape characteristic of being formed using an extrusion mechanism.
Abstract:
Systems, methods and/or devices are used to enable storage drive life estimation. In one aspect, the method includes (1) determining two or more age criteria of a storage drive, and (2) determining a drive age of the storage drive in accordance with the two or more age criteria of the storage drive.
Abstract:
An electronic system, and a method of manufacture thereof, including: a substrate; an electrical device over the substrate; and a surface mount heat sink next to the electrical device, the surface mount heat sink having an extruded shape characteristic of being formed using an extrusion mechanism.
Abstract:
Systems, methods and/or devices are used to enable a settings adjustment mechanism. In one aspect, the method includes (1) accessing characterization information corresponding to how a group of non-volatile memory devices of a storage control system operates as the group wears, (2) determining an estimated age of a non-volatile memory device, of the group of non-volatile memory devices, in accordance with a wear indicator for the non-volatile memory device, and (3) determining one or more settings for the non-volatile memory device in accordance with the estimated age and the characterization information.