CIRCUITRY TO PROTECT A TEST INSTRUMENT
    1.
    发明申请
    CIRCUITRY TO PROTECT A TEST INSTRUMENT 审中-公开
    电路保护测试仪器

    公开(公告)号:WO2015160687A1

    公开(公告)日:2015-10-22

    申请号:PCT/US2015/025531

    申请日:2015-04-13

    Applicant: TERADYNE, INC.

    Abstract: Controlling a test instrument may include: determining a first value corresponding to power output by the test instrument; determining a second value based on the first value, where the second value corresponds to an amount of energy consumed by the test instrument; and placing at least part of the test instrument in a high-impedance state when the second value exceeds a threshold.

    Abstract translation: 控制测试仪器可以包括:确定对应于由测试仪器输出的功率的第一值; 基于所述第一值确定第二值,其中所述第二值对应于所述测试仪器消耗的能量的量; 以及当所述第二值超过阈值时,将所述测试仪器的至少一部分置于高阻抗状态。

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