CIRCUITRY TO PROTECT A TEST INSTRUMENT
    1.
    发明申请
    CIRCUITRY TO PROTECT A TEST INSTRUMENT 审中-公开
    电路保护测试仪器

    公开(公告)号:WO2015160687A1

    公开(公告)日:2015-10-22

    申请号:PCT/US2015/025531

    申请日:2015-04-13

    Applicant: TERADYNE, INC.

    Abstract: Controlling a test instrument may include: determining a first value corresponding to power output by the test instrument; determining a second value based on the first value, where the second value corresponds to an amount of energy consumed by the test instrument; and placing at least part of the test instrument in a high-impedance state when the second value exceeds a threshold.

    Abstract translation: 控制测试仪器可以包括:确定对应于由测试仪器输出的功率的第一值; 基于所述第一值确定第二值,其中所述第二值对应于所述测试仪器消耗的能量的量; 以及当所述第二值超过阈值时,将所述测试仪器的至少一部分置于高阻抗状态。

    COMBINING CURRENT SOURCED BY CHANNELS OF AUTOMATIC TEST EQUIPMENT
    2.
    发明申请
    COMBINING CURRENT SOURCED BY CHANNELS OF AUTOMATIC TEST EQUIPMENT 审中-公开
    自动测试设备通道组合电流

    公开(公告)号:WO2018038780A1

    公开(公告)日:2018-03-01

    申请号:PCT/US2017/034486

    申请日:2017-05-25

    Applicant: TERADYNE, INC.

    Abstract: An example test system includes: multiple channels, where each of the multiple channels is configured to force voltage and to source current; and circuitry to combine current sourced by the multiple channels to produce a combined current for output on a single channel to a device under test (DUT), where each of the multiple channels includes a load sharing resistor to control a contribution of the channel to the combined current.

    Abstract translation: 示例测试系统包括:多个通道,其中多个通道中的每一个被配置为强制电压和源电流; 以及用于组合由多个通道产生的电流以产生用于在单个通道上输出到被测设备(DUT)的组合电流的电路,其中多个通道中的每一个包括负载分配电阻器以控制通道对 合并电流。

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