公开(公告)号：WO2016142945A1

公开(公告)日：2016-09-15

申请号：PCT/IL2016/050262

申请日：2016-03-10

Applicant: YEDA RESEARCH AND DEVELOPMENT CO. LTD.

Inventor： ZELDOV, Eli ,  EMBON, Lior ,  HALBERTAL, Dorri ,  ANAHORY, Yonathan ,  MYASOEDOV, Yuri ,  CUPPENS, Jo

IPC: G01Q60/58 ,  G01N27/00 ,  G01N25/18

CPC classification number: G01Q60/58 ,  G01N27/041

Abstract: A device and methods for use thereof in low-temperature thermal scanning microscopy, providing non-contact, non-invasive localized temperature and thermal conductivity measurements in nanometer scale ranges with a temperature resolution in the micro-Kelvin order. A superconductive cap mounted on the tip of an elongated support probe is electrically-connected to superconductive leads for carrying electrical current through the cap. The critical superconducting current of the leads is configured to be greater than the critical current supported by the cap, and the cap's critical current is configured to be a function of its temperature. Thus, the temperature of the cap is measured by measuring its critical superconducting current. In a related embodiment, driving a current greater than the critical current of the cap quenches the cap's superconductivity, and permits the cap to dissipate resistive heat into the sample being scanned. Scanning of the sample in this mode thus images its thermal conductivity patterns.

Abstract translation: 一种在低温热扫描显微镜中使用的装置及其方法，提供具有微开尔文次序的温度分辨率的纳米尺度范围内的非接触，非侵入性局部温度和热导率测量。 安装在细长支撑探针的尖端上的超导电帽电连接到超导引线，用于承载电流通过盖。 引线的临界超导电流被配置为大于由帽支持的临界电流，并且帽的临界电流被配置为其温度的函数。 因此，通过测量其临界超导电流来测量盖的温度。 在相关实施例中，驱动大于盖的临界电流的电流淬灭了帽的超导性，并且允许帽向被扫描的样品中散发电阻热。 因此，以此模式扫描样品可以显示其导热性图案。