公开(公告)号：WO2006035644A1

公开(公告)日：2006-04-06

申请号：PCT/JP2005/017364

申请日：2005-09-21

Applicant: 学校法人慶應義塾 ,  黒田 忠広 ,  溝口 大介 ,  三浦 典之

Inventor： 黒田 忠広 ,  溝口 大介 ,  三浦 典之

IPC: G01R31/315

CPC classification number: G01R31/315 ,  G01R31/3025

Abstract: 　誘導性結合によって基板間通信を行う電子回路を試験するのに好適で、テスト用のパッドを使わなくても電子回路を試験することができる電子回路試験装置を提供することを課題として、第１、第２送信コイル２１ａ、２１ｂ、及び第１、第２受信コイル２３ａ、２３ｂによる誘導性結合で構成される通信チャネルにプローブ１５を介入させて、テスタ１１、バッファ１２、１３、及びＴx／Ｒxスイッチ１４によってＬＳＩを試験する。これにより、電子回路試験装置に電子回路のパッドやリードと接触する針を設ける必要がなくなり寿命を長くすることができる。  

Abstract translation: 一种电子电路测试装置，适用于通过电感耦合测试基板之间的通信并且即使不使用测试垫来测试电子电路的电子电路。 探头（15）插入由第一和第二传递线圈（21a，21b）和第一和第二接收线圈（23a，23b）的电感耦合构成的连通通道中，并且LSI由测试器（11）测试， ，缓冲器（12,13）和Tx / Rx开关（14）。 因此，消除了在电子电路测试装置上提供针与电子电路的焊盘和引线接触的必要性，并且可以延长设备的使用寿命。

公开(公告)号：WO99032893A1

公开(公告)日：1999-07-01

申请号：PCT/US1998/027341

申请日：1998-12-21

IPC: G01R31/28 ,  G01R31/311 ,  G01R31/315 ,  G01R31/00

CPC classification number: G01R31/3025 ,  G01R31/2884 ,  G01R31/311 ,  G01R31/315

Abstract: The integrated circuit die incorporates a test circuit portion that includes a first electromagnetic receiver for receiving wireless electromagnetic radiation, and a first electromagnetic transmitting element for transmitting wireless electromagnetic radiation in response to the electromagnetic radiation received by the first electromagnetic receiver. The test apparatus includes a second electromagnetic transmitter for transmitting wireless electromagnetic radiation to the first receiver of the integrated circuit die, and a second electromagnetic receiver for receiving wireless electromagnetic radiation transmitted by the first transmitter of the integrated circuit die. According to the method of testing the semiconductor integrated circuit die, test signals are transmitted wirelessly from the test device to the test circuit portion of the semiconductor integrated circuit die. In response to those transmitted test signals, the test circuit portion of the die performs a test sequence, and transmits wireless response signals.

Abstract translation: 集成电路管芯包括测试电路部分，其包括用于接收无线电磁辐射的第一电磁接收器，以及用于响应于由第一电磁接收器接收的电磁辐射传输无线电磁辐射的第一电磁发射元件。 测试装置包括用于向集成电路管芯的第一接收器发送无线电磁辐射的第二电磁发射器，以及用于接收由集成电路管芯的第一发射器发送的无线电磁辐射的第二电磁接收器。 根据半导体集成电路管芯的测试方法，将测试信号从测试设备无线地传输到半导体集成电路管芯的测试电路部分。 响应于这些发送的测试信号，芯片的测试电路部分执行测试序列，并发送无线响应信号。

公开(公告)号：WO1996029610A2

公开(公告)日：1996-09-26

申请号：PCT/US1996001287

申请日：1996-02-02

Applicant: TERADYNE, INC. ,  SHEEN, Timothy, W.

Inventor： TERADYNE, INC.

IPC: G01R31/304

CPC classification number: G01R31/315 ,  G01R31/046 ,  G01R31/312

Abstract: A manufacturing defect analyzer for printed circuit boards which can detect open circuit faults between leads of components and the printed circuit board. The manufacturing defect analyzer can operate in an inductive coupling mode or a capacitive coupling mode. The same sensors are used in each mode, allowing different leads on the same part to be tested using either technique. A method is also disclosed whereby the device is used to rapidly and accurately detect manufacturing defects.

Abstract translation: 一种用于印刷电路板的制造缺陷分析仪，可以检测元件引线与印刷电路板之间的断路故障。 制造缺陷分析仪可以以电感耦合模式或电容耦合模式工作。 在每种模式下使用相同的传感器，允许使用任一技术对同一部件上的不同引线进行测试。 还公开了一种方法，由此该装置用于快速且准确地检测制造缺陷。

公开(公告)号：WO1995008125A1

公开(公告)日：1995-03-23

申请号：PCT/US1994010507

申请日：1994-09-16

Applicant: TERADYNE, INC.

Inventor： TERADYNE, INC. ,  SHEEN, Timothy, W. ,  CHEN, Jiann-Neng ,  COHEN, Stephen, A. ,  BAGLINO, Michael, A. ,  WRINN, Joseph, F.

IPC: G01R31/312

CPC classification number: G01R31/315 ,  G01R31/046 ,  G01R31/303

Abstract: An apparatus and method are disclosed for testing connections between printed circuit boards and components mounted thereon. A conductive loop is formed by forward biasing a parasitic diode that is inherently present between an integrated circuit (IC) lead and the ground plane of the IC. A magnetic field is created by an antenna mounted above the component to be tested. When the antenna is energized by an RF source, a voltage is induced in the conductive loop if the loop is continuous, i.e., if all of the connections are properly made. The voltage in the loop is measured and compared to a selected threshold to produce a pass/fail indication. This tester may be implemented as an improvement to a standard type of "bed-of-nails" printed circuit board tester. The antenna may be implemented as an array of spiral loop antennas, with adjacent antennas producing magnetic fields that are 90 degrees out of phase with each other.

Abstract translation: 公开了一种用于测试安装在其上的印刷电路板和组件之间的连接的装置和方法。 通过正向偏置固有地存在于集成电路（IC）引线和IC的接地平面之间的寄生二极管来形成导通回路。 磁场由安装在待测组件上方的天线产生。 当天线被RF源激励时，如果环路是连续的，即如果所有的连接都被适当地制造，则在导电回路中感应出电压。 测量回路中的电压并将其与选定的阈值进行比较，以产生通过/失败指示。 该测试器可以被实现为对标准类型的“床钉”印刷电路板测试器的改进。 天线可以被实现为螺旋环形天线的阵列，其中相邻的天线产生彼此相差90度的磁场。

公开(公告)号：WO2016205085A1

公开(公告)日：2016-12-22

申请号：PCT/US2016/036910

申请日：2016-06-10

Applicant: SIKORSKY AIRCRAFT CORPORATION

Inventor： KALGREN, Patrick, W. ,  GRAVENSTEDE, Kenneth ,  GRUNDMAN, Evan ,  GORTON, John

IPC: G01R33/022 ,  G01D3/08 ,  G01D5/12

CPC classification number: G01R31/315 ,  G01R31/2837 ,  G01R31/42 ,  G01R33/022

Abstract: A Transistor Resonant Characteristic Sensor (TReCS) includes a sensing element positioned along electronic equipment so that the sensing element is electromagnetic ally coupled to the electronic equipment. The sensing element includes a coil. The sensing element is configured to detect magnetic oscillations associated with a characteristic signal generated by the electronic equipment. The TReCS sensor further includes an evaluation circuit connected to the sensing element for monitoring health state of the electronic equipment. The evaluation circuit includes one or more processing elements configured to diagnose health state of the electronic equipment based on extracted baseband information associated with the characteristic signal.

Abstract translation: 晶体管谐振特性传感器（TReCS）包括沿着电子设备定位的感测元件，使得感测元件电磁耦合到电子设备。 感测元件包括线圈。 感测元件被配置为检测与由电子设备产生的特征信号相关联的磁振荡。 TReCS传感器还包括连接到感测元件的评估电路，用于监测电子设备的健康状态。 评估电路包括一个或多个处理元件，其被配置为基于与特征信号相关联的提取的基带信息来诊断电子设备的健康状态。

公开(公告)号：WO2011070394A1

公开(公告)日：2011-06-16

申请号：PCT/IB2009/055567

申请日：2009-12-08

Applicant: NXP B.V. ,  ESHOLD, Jochen ,  HOLTZ, Tom ,  BASILE, Giovanni ,  HEIDRICH, Oliver

Inventor： ESHOLD, Jochen ,  HOLTZ, Tom ,  BASILE, Giovanni ,  HEIDRICH, Oliver

IPC: G01R31/315 ,  G01R31/28 ,  G01R33/09

CPC classification number: G01R31/315 ,  G01R31/2829 ,  G01R31/2863 ,  G01R33/09

Abstract: A controller for a test head module (106) of a test cell (100) includes a control signal generator, an electronic memory device, and a signal evaluation module. The control signal generator to provide control signals to a plurality of magnetic stimulator heads, which provide magnetic stimulus signals to singulated devices for testing in response to the control signals. The electronic memory device stores instructions for controlling concurrent activation of at least two of the magnetic stimulator heads for parallel testing of the singulated devices. The signal evaluation module receives electrical signals from the singulated devices. The electrical signals from the singulated devices are dependent on the magnetic stimulus signals applied to the singulated devices.

Abstract translation: 用于测试单元（100）的测试头模块（106）的控制器包括控制信号发生器，电子存储器件和信号评估模块。 所述控制信号发生器向多个磁刺激头提供控制信号，所述磁刺激器头响应于所述控制信号向所述单个设备提供磁刺激信号进行测试。 电子存储装置存储用于控制至少两个磁刺激头的并发激活的指令，用于并行测试单个化装置。 信号评估模块从单独的装置接收电信号。 来自分离器件的电信号取决于施加到单个器件的磁刺激信号。

公开(公告)号：WO2005081000A1

公开(公告)日：2005-09-01

申请号：PCT/CH2004/000096

申请日：2004-02-23

Applicant: ASETRONICS AG ,  SPRING, Thomas

Inventor： SPRING, Thomas

IPC: G01R31/00

CPC classification number: G01R31/309 ,  G01R31/315

Abstract: The inventive method and apparatus allow non-contact testing of electronic modules, in particular electronic circuit boards (10), by performing the steps of disposing at least one electromagnetic emission sensing probe or a probe array (1, 1 1-1, 11 1-2 , ..., l X-Y ) a short distance from an electronic module (10) under test; applying test signals to operate the circuit board while sensing electromagnetic emission from a region of the circuit board near the probe or the probe array (1, l 1-1 , 1 1-2 , ..., 1 x-y ); receiving time domain signals provided by the probe or the probe array (1, 1 1-1 , 1 1-2 , ..., 1 x-y ); simultaneously or sequentially establishing frequency domain information of the sensed electromagnetic emission for n sub-ranges of a second frequency range that is contained in the audible frequency range; and selectively emitting audible signals that correspond to the frequency domain information in the second frequency range. The acoustical signature, resulting from said procedures, can be perceived by the operator of the apparatus and compared to a previously heard acoustical signature of an already proven electronic module in order to detect a malfunction of the electronic circuit board (10) under test.

Abstract translation: 本发明的方法和装置允许电子模块，特别是电子电路板（10）的非接触测试，通过执行以下步骤：设置至少一个电磁发射感测探针或探针阵列（1,11-1,11- 2，...，lX-Y）距离被测电子模块（10）很短距离; 施加测试信号以操作电路板，同时检测来自探针或探针阵列（1,11-1,11-2，...，1x-y）附近的电路板的区域的电磁发射; 接收由探针或探针阵列（1,11-1,11-2，...，1x-y）提供的时域信号; 同时或顺序地建立感测电磁辐射的频域信息，用于包含在可听频率范围内的第二频率范围的n个子范围; 并且选择性地发射与第二频率范围内的频域信息相对应的声音信号。 由所述程序产生的声学签名可以由设备的操作者感知，并与已经被验证的电子模块的先前听到的声学签名进行比较，以便检测被测试的电子电路板（10）的故障。

公开(公告)号：WO9629610A3

公开(公告)日：1996-12-05

申请号：PCT/US9601287

申请日：1996-02-02

Applicant: TERADYNE INC ,  SHEEN TIMOTHY W

Inventor： SHEEN TIMOTHY W

IPC: G01R31/02 ,  G01R31/04 ,  G01R31/28 ,  G01R31/312 ,  G01R31/315 ,  G01R31/304

CPC classification number: G01R31/315 ,  G01R31/046 ,  G01R31/312

Abstract: A manufacturing defect analyzer for printed circuit boards which can detect open circuit faults between leads of components and the printed circuit board. The manufacturing defect analyzer can operate in an inductive coupling mode or a capacitive coupling mode. The same sensors are used in each mode, allowing different leads on the same part to be tested using either technique. A method is also disclosed whereby the device is used to rapidly and accurately detect manufacturing defects.

公开(公告)号：WO2014121928A1

公开(公告)日：2014-08-14

申请号：PCT/EP2014/000311

申请日：2014-02-05

Applicant: GIESECKE & DEVRIENT GMBH

Inventor： FINKENZELLER, Klaus ,  BALDISCHWEILER, Michael

IPC: G01R31/315 ,  G01R31/28

CPC classification number: G01R31/315 ,  H04B5/0075 ,  H04B17/16

Abstract: Ein Verfahren zum Prüfen eines zur kontaktlosen Datenkommunikation eingerichteten Schaltkreises (20), welcher eine Antenne (22) und ein mit der Antenne (22) gekoppeltes elektronisches Bauteil (24) umfasst, umfasst daher die folgenden Schritte: Erzeugen (Sl) eines magnetischen Wechselfeldes einer Feldstärke und Anordnen (S2) des Schaltkreises (20) in dem Wechselfeldbereich. Dann wird der elektronische Schaltkreis (20) mittels eines Energiepulses angeregt (S3). In einem weiteren Schritt wird eine Schwingung des Schaltkreises (20) in Antwort auf die Anregung des Schaltkreises durch den Energiepuls erfasst (S4). Die erfasste Schwingung des Schaltkreises (20) wird schließlich ausgewertet (S5), insbesondere hinsichtlich einer Eigenresonanz frequenz des Schaltkreises (20).

Abstract translation: 因此测试设置用于非接触式数据通信电路（20），包括天线（22）和到所述天线（22）耦合的电子元件（24）的方法，包括以下步骤：生成的交变磁场的（S1）中 在交变磁场区域中的电路（20）的场强和排列（S2）。 然后，将电子电路（20）由一个能量脉冲的装置被激励（S3）。 在进一步的步骤中检测响应于由所述能量脉冲电路的激励的开关电路（20）的振荡（S4）。 然后将电路（20）的检测到的振荡进行分析（S5），特别是关于到电路（20）的固有共振频率。

公开(公告)号：WO2013074068A1

公开(公告)日：2013-05-23

申请号：PCT/US2011/060603

申请日：2011-11-14

Applicant: NEOCERA, LLC ,  OROZCO, Antonio ,  TALANOV, Vladimir, V. ,  CAWTHORNE, Alfred, Benjamin ,  GAGLIOLO, Nicolas, Eric

Inventor： OROZCO, Antonio ,  TALANOV, Vladimir, V. ,  CAWTHORNE, Alfred, Benjamin ,  GAGLIOLO, Nicolas, Eric

IPC: G01R33/035

CPC classification number: G01R31/088 ,  G01N27/82 ,  G01R31/08 ,  G01R31/308 ,  G01R31/315 ,  G01R33/0356

Abstract: Non-destructive localization of open defects in electronic devices is performed with a DC SQUID based RF magnetometer capable of sensing coherent magnetic fields up to 200 MHz and higher. RF magnetic fields (or RF current) images are correlated to conductive paths layout of the electronic device, and the open defect is pinpointed at a location of RF current disappearance on the current image. The bandwidth limitations associated with transmission line delays between SQUID circuit and readout electronic, as well as with near- field coupling between different parts of the measurement scheme, are overcome by superimposing the RF flux emanating from device under study on the modulation flux to produce at the SQUID output a binary phase modulated RF voltage, which is processed to lock the static flux, and to control modulation regime by producing an AC bias for the RF flux, RF readout electronics is based on a double lock- in through sequential demodulation of the RF component of the output SQUID voltage at the modulation flux frequency mm and the RF flux frequency ϖ RF .

Abstract translation: 使用能够感测高达200MHz及更高​​的相干磁场的基于DC SQUID的RF磁力计来执行电子设备中的开放缺陷的非破坏性定位。 RF磁场（或RF电流）图像与电子设备的导电路径布局相关，并且在当前图像上的RF电流消失的位置处精确定位开放缺陷。 与SQUID电路和读出电子之间的传输线延迟相关的带宽限制以及测量方案的不同部分之间的近场耦合被克服，将从研究器件发出的RF通量叠加在调制通量上，以产生 SQUID输出二进制相位调制RF电压，其被处理以锁定静态通量，并且通过产生用于RF通量的AC偏置来控制调制方式，RF读出电子器件基于双重锁定，通过对 RF分量的输出SQUID电压处于调制通量频率mm和RF通量频率πRF。