发明公开
- 专利标题: Plasma treatment equipment and impedance measurement tool
- 专利标题(中): 一种等离子体处理装置和工具,用于阻抗测量
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申请号: EP03023423.1申请日: 1999-11-25
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公开(公告)号: EP1406292A3公开(公告)日: 2004-06-09
- 发明人: Nakano, Akira , Kim, Sung, Chul , Fukuda, Koichi , Kasama, Yasuhiko , Ohmi, Tadahiro , Ono, Shoichi
- 申请人: ALPS ELECTRIC CO., LTD. , Ohmi, Tadahiro
- 申请人地址: 1-7 Yukigaya Otsuka-cho Ota-ku Tokyo 145 JP
- 专利权人: ALPS ELECTRIC CO., LTD.,Ohmi, Tadahiro
- 当前专利权人: ALPS ELECTRIC CO., LTD.,Ohmi, Tadahiro
- 当前专利权人地址: 1-7 Yukigaya Otsuka-cho Ota-ku Tokyo 145 JP
- 代理机构: Kensett, John Hinton
- 优先权: JP34080698 19981130
- 主分类号: H01J37/32
- IPC分类号: H01J37/32 ; G01R27/22
摘要:
The invention provides a plasma equipment which is advantageous in that the suscepter impedance is small, the dependence on the frequency is low, the power consumption efficiency is high, the film forming speed is faster with comparison with the conventional plasma equipment, and the film quality is high. Metalplates (80a, 80b) AC short between a chamber wall (10) and a shield (12) of an electrode of the same DC potential as the chamber.
公开/授权文献
- EP1406292B1 Plasma treatment equipment and impedance measurement tool 公开/授权日:2005-04-13
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