发明授权
- 专利标题: METHOD AND APPARATUS FOR SECURE SCAN TESTING
- 专利标题(中): 方法和设备用于安全扫描测试
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申请号: EP03721656.1申请日: 2003-04-14
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公开(公告)号: EP1499906B1公开(公告)日: 2006-01-04
- 发明人: TKACIK, Thomas , SPITTAL, John, E., Jr. , LUTZ, Jonathan , CASE, Lawrence , HARDY, Douglas , REDMAN, Mark , SCHMIDT, Gregory , TUGENBERG, Steven , FITZSIMMONS, Michael, D. , CARDER, Darrell, L.
- 申请人: Freescale Semiconductor, Inc.
- 申请人地址: 6501 William Cannon Drive West Austin, Texas 78735 US
- 专利权人: Freescale Semiconductor, Inc.
- 当前专利权人: Freescale Semiconductor, Inc.
- 当前专利权人地址: 6501 William Cannon Drive West Austin, Texas 78735 US
- 代理机构: Wray, Antony John
- 优先权: US135877 20020430
- 国际公布: WO2004051294 20040617
- 主分类号: G01R31/3185
- IPC分类号: G01R31/3185 ; G06F1/00
摘要:
A processor, scan controller, and method for protecting sensitive information from electronic hacking is disclosed. To maintain the security of the sensitive data present in a processor, the scan controller denies access to the scan chain until data is cleared from scan-observable portions of the processor, then clears the scan chain again prior to exiting test mode and resuming normal operation. Clearing or otherwise modifying data stored in the scan-observable portions of a processor when transitioning to and/or from a test mode will prevent unauthorized personnel from simply shifting secure data out of the scan chain, and from pre-loading data into the scan chain prior to normal operation in an attempt to set sensitive state information.
公开/授权文献
- EP1499906A1 METHOD AND APPARATUS FOR SECURE SCAN TESTING 公开/授权日:2005-01-26
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