- 专利标题: Lithographic apparatus and method
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申请号: US14762452申请日: 2014-02-05
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公开(公告)号: US10001713B2公开(公告)日: 2018-06-19
- 发明人: Santiago E. Del Puerto , Matthew Lipson , Kenneth C. Henderson , Raymond Wilhelmus Louis LaFarre , Louis John Markoya , Tammo Uitterdijk , Johannes Petrus Martinus Bernardus Vermeulen , Antonius Franciscus Johannes De Groot , Ronald Van Der Wilk
- 申请人: ASML Holding N.V. , ASML Netherlands B.V.
- 申请人地址: NL Veldhoven NL Veldhoven
- 专利权人: ASML Holding N.V.,ASML Netherlands B.V.
- 当前专利权人: ASML Holding N.V.,ASML Netherlands B.V.
- 当前专利权人地址: NL Veldhoven NL Veldhoven
- 代理机构: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- 国际申请: PCT/EP2014/052204 WO 20140205
- 国际公布: WO2014/122151 WO 20140814
- 主分类号: G03B27/52
- IPC分类号: G03B27/52 ; G03F7/20 ; H01L21/67 ; H01L21/683 ; H01L21/687
摘要:
A support such as a clamp (310) is configured to releasably hold a patterning device such as a reticle (300) to secure it and prevent heat-induced deformation of it. For example, an electrostatic clamp includes a first substrate (312) having opposing first (313) and second (315) surfaces, a plurality of burls (316) located on the first surface and configured to contact the reticle, a second substrate (314) having opposing first (317) and second (319) surfaces. The first surface of the second substrate is coupled to the second surface of the first substrate. A plurality of cooling elements (318) are located between the first surface of the second substrate and the second surface of the first substrate. The cooling elements are configured to cause electrons to travel from the second surface of the first substrate to the first surface of the second substrate. Each cooling element is substantially aligned with a respective burl.
公开/授权文献
- US20150370180A1 Lithographic Apparatus and Method 公开/授权日:2015-12-24
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