Invention Grant
- Patent Title: Semiconductor device and method of fabricating the same
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Application No.: US15288080Application Date: 2016-10-07
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Publication No.: US10090413B2Publication Date: 2018-10-02
- Inventor: Ki Hwan Kim , Gigwan Park , Junggun You , DongSuk Shin , Jin-Wook Kim
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2015-0148961 20151026
- Main IPC: H01L29/78
- IPC: H01L29/78 ; H01L29/16 ; H01L23/535 ; H01L27/11 ; H01L21/8238 ; H01L27/092 ; H01L29/06 ; H01L29/08 ; H01L29/161 ; H01L29/165 ; H01L29/66

Abstract:
A semiconductor device includes first and second active patterns protruding upward from a substrate, a gate electrode crossing the first and second active patterns and extending in a first direction, a first source/drain region on the first active pattern and on at least one side of the gate electrode, and a second source/drain region on the second active pattern and on at least one side of the gate electrode. The first and second source/drain regions have a conductivity type different from each other, and the second source/drain region has a bottom surface in contact with a top surface of the second active pattern and at a lower level than that of a bottom surface of the first source/drain region in contact with a top surface of the first active pattern. The first active pattern has a first width smaller than a second width of the second active pattern.
Public/Granted literature
- US20170117411A1 SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME Public/Granted day:2017-04-27
Information query
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