Invention Grant
- Patent Title: Methods of fabricating semiconductor devices
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Application No.: US15603668Application Date: 2017-05-24
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Publication No.: US10211210B2Publication Date: 2019-02-19
- Inventor: Jinwon Ma , Jun-Noh Lee , Dong-Hyun Im , Youngseok Kim , Kongsoo Lee
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Ward and Smith, P.A.
- Priority: KR10-2016-0065887 20160527
- Main IPC: H01L27/108
- IPC: H01L27/108 ; H01L21/768

Abstract:
A method of fabricating a semiconductor device includes forming an interlayer insulating structure on a substrate, forming a contact hole that penetrates the interlayer insulating structure to expose the substrate, forming an amorphous silicon layer including a first portion and a second portion, the first portion covering a top surface of the substrate exposed by the contact hole, the second portion covering a sidewall of the contact hole, providing hydrogen atoms into the amorphous silicon layer, and crystallizing the first portion using the substrate as a seed.
Public/Granted literature
- US20170345824A1 Methods of Fabricating Semiconductor Devices Public/Granted day:2017-11-30
Information query
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