Invention Grant
- Patent Title: Method of redistribution layer formation for advanced packaging applications
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Application No.: US15844989Application Date: 2017-12-18
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Publication No.: US10229827B2Publication Date: 2019-03-12
- Inventor: Han-Wen Chen , Steven Verhaverbeke , Roman Gouk , Guan Huei See , Yu Gu , Arvind Sundarrajan
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: APPLIED MATERIALS, INC.
- Current Assignee: APPLIED MATERIALS, INC.
- Current Assignee Address: US CA Santa Clara
- Agency: Patterson + Sheridan LLP
- Main IPC: H01L21/31
- IPC: H01L21/31 ; H01L21/02 ; H01L23/538 ; H01L21/48 ; H01L21/311 ; G03F7/00 ; H01L21/027

Abstract:
Embodiments of the present disclosure generally describe methods of forming one or more device terminal redistribution layers using imprint lithography. The methods disclosed herein enable the formation of high aspect ratio interconnect structures at lower costs than conventional photolithography and etch processes. Further, the processes and methods described herein desirably remove, reduce, and/or substantially eliminate voids in the surrounding polymer layer formed during the polymer deposition process or subsequent thereto.
Public/Granted literature
- US20180374696A1 METHOD OF REDISTRIBUTION LAYER FORMATION FOR ADVANCED PACKAGING APPLICATIONS Public/Granted day:2018-12-27
Information query
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