Invention Grant
- Patent Title: Substrate processing apparatus
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Application No.: US14570116Application Date: 2014-12-15
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Publication No.: US10249478B2Publication Date: 2019-04-02
- Inventor: Nobutaka Sasaki , Takashi Kitazawa , Akihiro Yoshimura
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: IPUSA, PLLC
- Priority: JP2013-262207 20131219
- Main IPC: C23C16/00
- IPC: C23C16/00 ; H01J37/32

Abstract:
A substrate processing apparatus includes a chamber including a process chamber for performing a process on a substrate by a gas introduced thereto and an exhaust chamber for evacuating the gas in the process chamber, a shield member for separating the process chamber from the exhaust chamber provided in at least a part of a neighborhood of a side wall of the chamber, and a hollow relay member penetrating through the shield member for communicating the chamber with a pipe connected to a pressure gauge outside the chamber. The relay member is configured to receive a first gas flowing from the chamber into the relay member. The first gas has a first conductance. The first conductance is greater than a second conductance of a second gas flowing from the exhaust chamber into a gap between the relay member and the side wall of the chamber.
Public/Granted literature
- US20150179415A1 SUBSTRATE PROCESSING APPARATUS Public/Granted day:2015-06-25
Information query
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