Invention Grant
- Patent Title: Determining thermal time constants of processing systems
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Application No.: US15010965Application Date: 2016-01-29
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Publication No.: US10281964B2Publication Date: 2019-05-07
- Inventor: Can Hankendi , Manish Arora , Indrain Paul , Wei Huang , Srilatha Manne
- Applicant: Advanced Micro Devices, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Advanced Micro Devices, Inc.
- Current Assignee: Advanced Micro Devices, Inc.
- Current Assignee Address: US CA Santa Clara
- Main IPC: G06F1/20
- IPC: G06F1/20 ; G06F11/30

Abstract:
A processing system includes one or more processing units to perform operations and one or more sensors to measure a temperature concurrently with the one or more processing units performing the operations. The processing system also includes a controller to receive feedback indicating the temperature and to determine a peak temperature and a thermal time constant for heating of the processing system based on a comparison of the measured temperature to a first temperature that is predicted based on the peak temperature and a previously determined thermal time constant for heating. Some embodiments of the controller can control a performance state of the processing system based on the peak temperature and the thermal time constant for heating of the processing system.
Public/Granted literature
- US20170220022A1 DETERMINING THERMAL TIME CONSTANTS OF PROCESSING SYSTEMS Public/Granted day:2017-08-03
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