Invention Grant
- Patent Title: Automatic analyzer
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Application No.: US15310808Application Date: 2015-04-22
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Publication No.: US10288637B2Publication Date: 2019-05-14
- Inventor: Hideto Tamezane , Isao Yamazaki , Masaharu Nishida , Kumiko Kamihara
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2014-101657 20140515
- International Application: PCT/JP2015/062180 WO 20150422
- International Announcement: WO2015/174226 WO 20151119
- Main IPC: G01N35/10
- IPC: G01N35/10 ; G01N35/02 ; G01N35/00 ; G01L19/00 ; G01N1/14

Abstract:
A pressure signal process unit acquires data under a predetermined condition and a statistic distance between the acquired data and determination-purpose reference data stored in a storage unit is calculated. It is determined whether or not dispensing is abnormal and whether the determination-purpose reference data is suitable for an abnormality detection function to be properly fulfilled. If the determination-purpose reference data is not suitable for an abnormality detection function to be properly fulfilled, temporary determination-purpose reference data is prepared so as to be compared with the previously acquired data under a predetermined condition. If a difference therebetween is greater than a predetermined threshold value, a possibility that an automatic analyzer may have an abnormal component or that a failure may occur in the automatic analyzer is determined, and the result is transmitted to cause a display device to display an alarm.
Public/Granted literature
- US20170089938A1 AUTOMATIC ANALYZER Public/Granted day:2017-03-30
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