Invention Grant
- Patent Title: Method for estimating an operating profile of an integrated circuit of a system-on-a-chip, and corresponding system-on-a-chip
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Application No.: US15468798Application Date: 2017-03-24
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Publication No.: US10302693B2Publication Date: 2019-05-28
- Inventor: Vincent Huard , Chittoor Parthasarathy
- Applicant: STMicroelectronics (Crolles 2) SAS , STMicroelectronics SA
- Applicant Address: FR Crolles FR Montrouge
- Assignee: STMicroelectronics (Crolles 2) SAS,STMicroelectronics SA
- Current Assignee: STMicroelectronics (Crolles 2) SAS,STMicroelectronics SA
- Current Assignee Address: FR Crolles FR Montrouge
- Agency: Crowe & Dunlevy
- Priority: FR1657535 20160803
- Main IPC: G01R31/28
- IPC: G01R31/28
Abstract:
A system-on-a-chip includes an integrated circuit and an estimation circuit. The estimation circuit operates to acquire at least one physical parameter representative of the use of the integrated circuit and determine an instantaneous state of aging of the integrated circuit as a function of the at least one physical parameter. A margin of use of the integrated circuit is then calculated by comparing the instantaneous state of aging with a presumed state of aging.
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