- 专利标题: Talbot X-ray microscope
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申请号: US15954380申请日: 2018-04-16
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公开(公告)号: US10304580B2公开(公告)日: 2019-05-28
- 发明人: Wenbing Yun , David Vine , Sylvia Jia Yun Lewis , Janos Kirz , Srivatsan Seshadri
- 申请人: Sigray, Inc.
- 申请人地址: US CA Concord
- 专利权人: Sigray, Inc.
- 当前专利权人: Sigray, Inc.
- 当前专利权人地址: US CA Concord
- 代理机构: Knobbe, Martens, Olson & Bear, LLP
- 主分类号: G01N23/00
- IPC分类号: G01N23/00 ; G21K1/02 ; G01N23/083 ; G21K7/00
摘要:
Systems for x-ray microscopy using an array of micro-beams having a micro- or nano-scale beam intensity profile to provide selective illumination of micro- or nano-scale regions of an object. An array detector is positioned such that each pixel of the detector only detects x-rays corresponding to a single micro-or nano-beam. This allows the signal arising from each x-ray detector pixel to be identified with the specific, limited micro- or nano-scale region illuminated, allowing sampled transmission image of the object at a micro- or nano-scale to be generated while using a detector with pixels having a larger size and scale. Detectors with higher quantum efficiency may therefore be used, since the lateral resolution is provided solely by the dimensions of the micro- or nano-beams. The micro- or nano-scale beams may be generated using a arrayed x-ray source and a set of Talbot interference fringes.
公开/授权文献
- US20180261350A1 TALBOT X-RAY MICROSCOPE 公开/授权日:2018-09-13
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