Invention Grant
- Patent Title: Dummy assist features for pattern support
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Application No.: US15597277Application Date: 2017-05-17
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Publication No.: US10332745B2Publication Date: 2019-06-25
- Inventor: Lei Sun , Ruilong Xie , Wenhui Wang , Yulu Chen , Erik Verduijn , Zhengqing John Qi , Guoxiang Ning , Daniel J. Dechene
- Applicant: GLOBALFOUNDRIES Inc.
- Applicant Address: KY Grand Cayman
- Assignee: GLOBALFOUNDRIES Inc.
- Current Assignee: GLOBALFOUNDRIES Inc.
- Current Assignee Address: KY Grand Cayman
- Agency: Thompson Hine LLP
- Agent Anthony Canale
- Main IPC: H01L21/027
- IPC: H01L21/027 ; H01L21/033 ; H01L21/768 ; H01L21/3065

Abstract:
Methods of forming printed patterns and structures formed using printed patterns. A first line and a second line are lithographically printed in a first layer composed of photoimageable material with a space arranged between the first line and the second line. A dummy assist feature is also lithographically printed in the photoimageable material of the first layer. A second layer underlying the first layer is etched with the first line, the second line, and the dummy assist feature present as an etch mask. The dummy assist feature is arranged on a portion of the space adjacent to the first line and supports the photoimageable material of the first line during etching.
Public/Granted literature
- US20180337045A1 DUMMY ASSIST FEATURES FOR PATTERN SUPPORT Public/Granted day:2018-11-22
Information query
IPC分类: