Invention Grant
- Patent Title: Semiconductor device and method for fabricating the same
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Application No.: US15943657Application Date: 2018-04-02
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Publication No.: US10332981B1Publication Date: 2019-06-25
- Inventor: Yu-Ying Lin , Yi-Liang Ye , Sung-Yuan Tsai , Chun-Wei Yu , Yu-Ren Wang , Zhen Wu , Tai-Yen Lin
- Applicant: UNITED MICROELECTRONICS CORP.
- Applicant Address: TW Hsin-Chu
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW Hsin-Chu
- Agent Winston Hsu
- Priority: CN201810188894 20180308
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L29/66 ; H01L21/265 ; H01L21/3065 ; H01L21/306 ; H01L21/768 ; H01L29/78 ; H01L29/08 ; H01L21/285 ; H01L21/02

Abstract:
A method for fabricating semiconductor device includes the steps of: forming a first gate structure on a substrate; performing a first etching process to form a recess adjacent to the first gate structure; performing an ion implantation process to form an amorphous layer directly under the recess; performing a second etching process to remove the amorphous layer; and forming an epitaxial layer in the recess.
Information query
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