Invention Grant
- Patent Title: Tamper-respondent assemblies
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Application No.: US15800497Application Date: 2017-11-01
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Publication No.: US10334722B2Publication Date: 2019-06-25
- Inventor: William L. Brodsky , James A. Busby , Phillip Duane Isaacs , David C. Long
- Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Heslin Rothenberg Farley & Mesiti P.C.
- Agent Tihon Poltavets, Esq.; Kevin P. Radigan, Esq.
- Main IPC: H05K1/02
- IPC: H05K1/02 ; H05K1/03 ; H05K1/18 ; H05K1/09 ; H05K7/02 ; H05K3/30 ; H05K3/12 ; H05K3/46 ; H05K5/02

Abstract:
Tamper-respondent assemblies and methods of fabrication are provided which include a tamper-respondent electronic circuit structure. The tamper-respondent electronic circuit structure includes a tamper-respondent sensor. The tamper-respondent sensor includes, for instance, at least one flexible layer having opposite first and second sides, and circuit lines forming at least one resistive network. The circuit lines are disposed on at least one of the first or second side of the at least one flexible layer, and have a line width Wl≤200 μm, as well as a line-to-line spacing width Ws≤200 μm. In certain enhanced embodiments, the tamper-respondent sensor includes multiple flexible layers, with a first flexible layer having first circuit lines, and a second flexible layer having second circuit lines, where the first and second circuit lines may have different line widths, different line-to-line spacings, and/or be formed of different materials.
Public/Granted literature
- US20180070444A1 TAMPER-RESPONDENT ASSEMBLIES Public/Granted day:2018-03-08
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