Invention Grant
- Patent Title: Method for measuring metal ion permeability of polymer film and device for measuring metal ion permeability of polymer film
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Application No.: US15529813Application Date: 2016-01-29
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Publication No.: US10338020B2Publication Date: 2019-07-02
- Inventor: Jung Hak Kim , Young Kook Kim , Kwang Joo Lee , Hee Jung Kim , Se Ra Kim , Jung Ho Jo , Seung Hee Nam , Ji Ho Han
- Applicant: LG CHEM, LTD.
- Applicant Address: KR Seoul
- Assignee: LG CHEM, LTD.
- Current Assignee: LG CHEM, LTD.
- Current Assignee Address: KR Seoul
- Agency: Rothwell, Figg, Ernst & Manbeck, P.C.
- Priority: KR10-2015-0014332 20150129
- International Application: PCT/KR2016/001021 WO 20160129
- International Announcement: WO2016/122263 WO 20160804
- Main IPC: G01R15/08
- IPC: G01R15/08 ; G01R27/08 ; B23H5/00 ; G01N27/12 ; G01N27/447 ; G01N27/04 ; G01N27/14 ; G01N27/404

Abstract:
The present invention relates to a method for measuring metal ion permeability of a polymer film, comprising the steps of: applying a voltage to the polymer film at a temperature of 5° C. to 250° C., while one side of the polymer film is brought into contact with an electrolyte comprising metal ions, an organic solvent and an aqueous solvent; and measuring the change rate of resistance or change rate of current of the polymer film according to time, after the voltage is applied, and a device for measuring metal ion permeability of a polymer film used therefor.
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