Invention Grant
- Patent Title: Determining one or more characteristics of a pattern of interest on a specimen
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Application No.: US15243809Application Date: 2016-08-22
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Publication No.: US10359371B2Publication Date: 2019-07-23
- Inventor: Brian Duffy , Ashok Kulkarni , Michael Lennek , Allen Park
- Applicant: KLA-Tencor Corporation
- Applicant Address: US CA Milpitas
- Assignee: KLA-Tencor Corp.
- Current Assignee: KLA-Tencor Corp.
- Current Assignee Address: US CA Milpitas
- Agent Ann Marie Mewherter
- Main IPC: G06K9/64
- IPC: G06K9/64 ; G06T7/00 ; G01N21/95 ; H01L21/66 ; G01N21/956 ; G05B19/418

Abstract:
Methods and systems for determining characteristic(s) of patterns of interest (POIs) are provided. One system is configured to acquire output of an inspection system generated at the POI instances without detecting defects at the POI instances. The output is then used to generate a selection of the POI instances. The system then acquires output from an output acquisition subsystem for the selected POI instances. The system also determines characteristic(s) of the POI using the output acquired from the output acquisition subsystem.
Public/Granted literature
- US20170059491A1 Determining One or More Characteristics of a Pattern of Interest on a Specimen Public/Granted day:2017-03-02
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