Invention Grant
- Patent Title: Test devices and test systems
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Application No.: US15157799Application Date: 2016-05-18
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Publication No.: US10360992B2Publication Date: 2019-07-23
- Inventor: Dong-Gun Kim , Je-Young Park , Byung-Soo Moon
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2015-0116264 20150818
- Main IPC: G11C5/14
- IPC: G11C5/14 ; G11C29/56 ; G01R19/00 ; G11C29/50 ; G11C29/08 ; G01R31/317 ; G06F11/263 ; G11C29/12 ; G01R31/28 ; G11C29/10 ; G06F11/277 ; G01R31/319 ; G06F11/26 ; G01R17/00
Abstract:
A test device includes a data driver and a controller. The controller is configured to generate a test code by dividing a test sequence in a unit of n-bits. The data driver is configured to receive the generated test code and output one of input voltages to a device under test as a test signal based on the generated test code. A storage device stores a test sequence.
Public/Granted literature
- US20170053712A1 TEST DEVICES AND TEST SYSTEMS Public/Granted day:2017-02-23
Information query
