公开(公告)号：US10360992B2

公开(公告)日：2019-07-23

申请号：US15157799

申请日：2016-05-18

Applicant: Samsung Electronics Co., Ltd.

Inventor： Dong-Gun Kim ,  Je-Young Park ,  Byung-Soo Moon

IPC: G11C5/14 ,  G11C29/56 ,  G01R19/00 ,  G11C29/50 ,  G11C29/08 ,  G01R31/317 ,  G06F11/263 ,  G11C29/12 ,  G01R31/28 ,  G11C29/10 ,  G06F11/277 ,  G01R31/319 ,  G06F11/26 ,  G01R17/00

Abstract: A test device includes a data driver and a controller. The controller is configured to generate a test code by dividing a test sequence in a unit of n-bits. The data driver is configured to receive the generated test code and output one of input voltages to a device under test as a test signal based on the generated test code. A storage device stores a test sequence.