- Patent Title: Sidewall metal spacers for forming metal gates in quantum devices
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Application No.: US15891518Application Date: 2018-02-08
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Publication No.: US10361353B2Publication Date: 2019-07-23
- Inventor: Hubert C. George , Zachary R. Yoscovits , Nicole K. Thomas , Lester Lampert , James S. Clarke , Jeanette M. Roberts , Ravi Pillarisetty , David J. Michalak , Kanwaljit Singh , Roman Caudillo
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Patent Capital Group
- Main IPC: H01L29/06
- IPC: H01L29/06 ; H01L39/14 ; H01L39/22 ; H01L29/12 ; H01L29/15 ; H01L29/423 ; H01L29/40 ; H01L39/24 ; G06N10/00 ; H01L25/16 ; H01L23/00 ; H01L23/498

Abstract:
Disclosed herein are fabrication techniques for providing metal gates in quantum devices, as well as related quantum devices. For example, in some embodiments, a method of manufacturing a quantum device may include providing a gate dielectric over a qubit device layer, providing over the gate dielectric a pattern of non-metallic elements referred to as “gate support elements,” and depositing a gate metal on sidewalls of the gate support elements to form a plurality of gates of the quantum device.
Public/Granted literature
- US20190044048A1 SIDEWALL METAL SPACERS FOR FORMING METAL GATES IN QUANTUM DEVICES Public/Granted day:2019-02-07
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