- Patent Title: Signal transmission circuit device, semiconductor device, method and apparatus for inspecting semiconductor device, signal transmission device, and motor drive apparatus using signal transmission device
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Application No.: US15463121Application Date: 2017-03-20
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Publication No.: US10382035B2Publication Date: 2019-08-13
- Inventor: Daiki Yanagishima , Toshiyuki Ishikawa , Hirotaka Takihara
- Applicant: Rohm Co., Ltd.
- Applicant Address: JP Kyoto
- Assignee: Rohm Co., Ltd.
- Current Assignee: Rohm Co., Ltd.
- Current Assignee Address: JP Kyoto
- Agency: Fish & Richardson P.C.
- Priority: JP2009253900 20091105; JP2009273598 20091201; JP2010104192 20100428
- Main IPC: H03K17/691
- IPC: H03K17/691 ; G01R31/27 ; H03K17/61 ; H04L25/02 ; G01R31/28 ; H02P31/00

Abstract:
Disclosed is a signal transmission circuit device (200) including a feedback signal transmission unit (210) that feeds back a control output signal (Sout) as a feedback signal (Sf) to an input side circuit (200A). A logical comparison circuit (212) detects “mismatch” between input and output by performing logical comparison between a control input signal (Sin) and the feedback signal (Sf). When a state of “mismatch” between input and output occurs, a first pulse generating circuit (202) or a second pulse generating circuit (204) outputs a first correction signal (Sa1) or a second correction signal (Sa2) corresponding to a potential (high level or low level) of the control input signal (Sin), and corrects the control output signal (Sout) to the same potential (high level or low level) as the control input signal (Sin). With such configuration, the mismatch between input and output can be automatically corrected.
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