Invention Grant
- Patent Title: Shared error detection and correction memory
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Application No.: US15183654Application Date: 2016-06-15
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Publication No.: US10395748B2Publication Date: 2019-08-27
- Inventor: Tomoyuki Shibata , Chikara Kondo , Hiroyuki Tanaka
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dorsey & Whitney LLP
- Main IPC: G11C29/38
- IPC: G11C29/38 ; G11C29/44 ; G11C29/00 ; G11C29/12 ; G11C29/14 ; G11C29/36 ; G11C29/42 ; G11C29/48 ; G11C5/02 ; G11C29/04

Abstract:
Apparatuses and methods of sharing error correction memory on an interface chip are described. An example apparatus includes: at least one memory chip having a plurality of first memory cells and an interface chip coupled to the at least one memory chip and having a control circuit and a storage area. The control circuit detects one or more defective memory cells of the first memory cells of the at least one memory chip. The control circuit further stores first defective address information of the one or more defective memory cells of the first memory cells into the storage area. The interface chip responds to the first defective address information and an access request to access the storage area in place of the at least one memory chip when the access request has been provided with respect to the one or more defective memory cells of the first memory cells.
Public/Granted literature
- US20170365356A1 SHARED ERROR DETECTION AND CORRECTION MEMORY Public/Granted day:2017-12-21
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