Invention Grant
- Patent Title: Method for fabricating semiconductor device
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Application No.: US16404749Application Date: 2019-05-07
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Publication No.: US10446667B2Publication Date: 2019-10-15
- Inventor: Yu-Ying Lin , Yi-Liang Ye , Sung-Yuan Tsai , Chun-Wei Yu , Yu-Ren Wang , Zhen Wu , Tai-Yen Lin
- Applicant: UNITED MICROELECTRONICS CORP.
- Applicant Address: TW Hsin-Chu
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW Hsin-Chu
- Agent Winston Hsu
- Priority: CN201810188894 20180308
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L29/66 ; H01L21/768 ; H01L21/3065 ; H01L21/306 ; H01L21/285 ; H01L29/78 ; H01L21/265 ; H01L29/08 ; H01L21/02 ; H01L21/3115

Abstract:
A method for fabricating semiconductor device includes the steps of: forming a first gate structure on a substrate; performing a first etching process to form a recess adjacent to the first gate structure; performing an ion implantation process to form an amorphous layer directly under the recess; performing a second etching process to remove the amorphous layer; and forming an epitaxial layer in the recess.
Public/Granted literature
- US20190280106A1 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE Public/Granted day:2019-09-12
Information query
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