Invention Grant
- Patent Title: Mass spectrometry device and ion detection method therefor
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Application No.: US16069066Application Date: 2016-01-21
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Publication No.: US10453663B2Publication Date: 2019-10-22
- Inventor: Shinichi Murakami , Yasushi Terui
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Current Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Miles & Stockbridge, P.C.
- International Application: PCT/JP2016/051636 WO 20160121
- International Announcement: WO2017/126067 WO 20170727
- Main IPC: H01J49/00
- IPC: H01J49/00 ; H01J49/02 ; H01J49/42

Abstract:
An object of the invention is to provide a mass spectrometry device and an ion detection method therefor in which an ion amount can be detected with high accuracy.In order to achieve the object described above, a mass spectrometry device is provided which performs a channel scan measurement by changing a voltage to be applied to a mass separation unit to selectively extract a desired ion. The mass spectrometry device includes: an ion detection unit which detects an ion separated by the mass separation unit and outputs an electric signal; an ion amount measuring unit which measures an ion amount from the output of the ion detection unit; and an ion amount correction unit which corrects a detection amount of ion from an output of the ion amount measuring unit. In a process of a channel scan, the ion amount correction unit performs correction of a detection amount of ion detected in a present channel based on a detection amount of ion in a previous channel.
Public/Granted literature
- US20190027350A1 MASS SPECTROMETRY DEVICE AND ION DETECTION METHOD THEREFOR Public/Granted day:2019-01-24
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