Invention Grant
- Patent Title: Method of fabricating semiconductor device
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Application No.: US16392046Application Date: 2019-04-23
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Publication No.: US10573806B1Publication Date: 2020-02-25
- Inventor: Kyungtae Nam , Seung Pil Ko , Woojin Kim , Hyunchul Shin , Youngsoo Choi
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Lee IP Law, PC
- Priority: KR10-2018-0113513 20180921
- Main IPC: H01L43/12
- IPC: H01L43/12 ; H01L43/08 ; H01L27/22 ; G11C11/16 ; H01L43/02

Abstract:
A method of fabricating a semiconductor device includes forming a magnetic tunnel junction layer including a first magnetic layer, a second magnetic layer, and a tunnel barrier layer interposed between the first and second magnetic layers, patterning the magnetic tunnel junction layer to form a magnetic tunnel junction pattern, forming an insulating layer to cover the magnetic tunnel junction pattern, and performing a thermal treatment process to crystallize at least a portion of the first and second magnetic layers. The thermal treatment process may include performing a first thermal treatment process at a first temperature, after the forming of the magnetic tunnel junction layer, and performing a second thermal treatment process at a second temperature, which is higher than or equal to the first temperature, after the forming of the insulating layer.
Information query
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