Memories configured to control discharge of a control gate voltage of a transistor connected between a data line and a common source
Abstract:
Memory might include control logic configured to apply an erase pulse to a data line and to a common source concurrently with applying a higher second voltage level to a control gate of a transistor connected between the data line and the common source, concurrently discharge the voltage level of the data line and the voltage level of the common source, monitor a representation of a voltage difference between the voltage level of the data line and the voltage level of the control gate of the transistor, activate a current path between the control gate of the transistor and the common source in response to the voltage difference being deemed to be greater than a first value, and deactivate the current path between the control gate of the transistor and the common source in response to the voltage difference being deemed to be less than a second value.
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