Invention Grant
- Patent Title: Measuring internal voltages of packaged electronic devices
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Application No.: US16526801Application Date: 2019-07-30
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Publication No.: US10732660B2Publication Date: 2020-08-04
- Inventor: Maciej Piotr Jankowski , Peng Cao
- Applicant: TEXAS INSTRUMENTS INCORPORATED
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent John R. Pessetto; Charles A. Brill; Frank D. Cimino
- Main IPC: H03M3/00
- IPC: H03M3/00 ; G05F3/16 ; G01R31/28

Abstract:
An method comprising activating an internal switch within a packaged electronic device to connect to a reference ground of an internal voltage source to a first input of an analog front end, receiving an external ground potential voltage at a first package pin of the packaged electronic device, generating a zero detector output signal for the packaged electronic device at a second package pin, activating the internal switch to connect the first input of the analog front end to the internal voltage source, receiving a second voltage level at the first package pin that generates a second output signal that matches the zero detector output signal, and receiving trim instructions to trim an internal voltage generated by the internal voltage source to a voltage level that is closer to a target voltage level.
Public/Granted literature
- US20200081473A1 MEASURING INTERNAL VOLTAGES OF PACKAGED ELECTRONIC DEVICES Public/Granted day:2020-03-12
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