发明授权
- 专利标题: Wireless test system for testing microelectronic devices integrated with antenna
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申请号: US16359954申请日: 2019-03-20
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公开(公告)号: US10852349B2公开(公告)日: 2020-12-01
- 发明人: Chih-Yang Liu , Ying-Chou Shih , Yen-Ju Lu , Chih-Ming Hung , Jui-Lin Hsu
- 申请人: MEDIATEK INC.
- 申请人地址: TW Hsin-Chu
- 专利权人: MEDIATEK INC.
- 当前专利权人: MEDIATEK INC.
- 当前专利权人地址: TW Hsin-Chu
- 代理商 Winston Hsu
- 主分类号: G01R31/30
- IPC分类号: G01R31/30 ; G01R31/302 ; G01R31/28 ; G01R31/303 ; H01Q1/22 ; G01R1/04
摘要:
A wireless test system includes a load board having an upper surface and a lower surface. The load board has a testing antenna disposed on the load board. A socket for receiving a device under test (DUT) having an antenna structure therein is disposed on the upper surface of the load board. The antenna structure is aligned with the testing antenna. The wireless test system further includes a handler for picking up and delivering the DUT to the socket. The handler has a clamp for holding and pressing the DUT. The clamp is grounded during testing and functions as a ground reflector that reflects and reverses radiation pattern of the DUT from an upward direction to a downward direction toward the testing antenna.