Invention Grant
- Patent Title: Wireless test system for testing microelectronic devices integrated with antenna
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Application No.: US16359954Application Date: 2019-03-20
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Publication No.: US10852349B2Publication Date: 2020-12-01
- Inventor: Chih-Yang Liu , Ying-Chou Shih , Yen-Ju Lu , Chih-Ming Hung , Jui-Lin Hsu
- Applicant: MEDIATEK INC.
- Applicant Address: TW Hsin-Chu
- Assignee: MEDIATEK INC.
- Current Assignee: MEDIATEK INC.
- Current Assignee Address: TW Hsin-Chu
- Agent Winston Hsu
- Main IPC: G01R31/30
- IPC: G01R31/30 ; G01R31/302 ; G01R31/28 ; G01R31/303 ; H01Q1/22 ; G01R1/04

Abstract:
A wireless test system includes a load board having an upper surface and a lower surface. The load board has a testing antenna disposed on the load board. A socket for receiving a device under test (DUT) having an antenna structure therein is disposed on the upper surface of the load board. The antenna structure is aligned with the testing antenna. The wireless test system further includes a handler for picking up and delivering the DUT to the socket. The handler has a clamp for holding and pressing the DUT. The clamp is grounded during testing and functions as a ground reflector that reflects and reverses radiation pattern of the DUT from an upward direction to a downward direction toward the testing antenna.
Public/Granted literature
- US20190310314A1 WIRELESS TEST SYSTEM FOR TESTING MICROELECTRONIC DEVICES INTEGRATED WITH ANTENNA Public/Granted day:2019-10-10
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