- 专利标题: Super-resolution microscopy
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申请号: US16311652申请日: 2017-06-20
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公开(公告)号: US10901230B2公开(公告)日: 2021-01-26
- 发明人: Gary Mark Skinner , Geraint Wyn Evans , Stanley S. Hong , John A. Moon , M. Shane Bowen , Jonathan Mark Boutell , Jason Richard Betley
- 申请人: ILLUMINA, INC. , ILLUMINA CAMBRIDGE LIMITED
- 申请人地址: US CA San Diego; GB Cambridge
- 专利权人: ILLUMINA, INC.,ILLUMINA CAMBRIDGE LIMITED
- 当前专利权人: ILLUMINA, INC.,ILLUMINA CAMBRIDGE LIMITED
- 当前专利权人地址: US CA San Diego; GB Cambridge
- 代理机构: Illumina, Inc.
- 国际申请: PCT/US2017/038259 WO 20170620
- 国际公布: WO2017/223041 WO 20171228
- 主分类号: G02B21/00
- IPC分类号: G02B21/00 ; G02B27/58 ; G02B21/36
摘要:
Example super-resolution microscopy systems are described herein that are configured for relatively high throughput. The disclosed microscopy systems can be to generate an array of sub-diffraction activated areas for imaging. The microscopy systems can be to utilize imaging techniques that employ time delay integration to build up super-resolution images over time. The disclosed microscopy systems can utilize long-lived fluorophores in conjunction with wide field and patterned illumination to generate super-resolution images of a sample with relatively high throughput.
公开/授权文献
- US20190219835A1 SUPER-RESOLUTION MICROSCOPY 公开/授权日:2019-07-18
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