Invention Grant
- Patent Title: Method for detecting an attack by means of a beam of electrically charged particles on an integrated circuit, and corresponding integrated circuit
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Application No.: US16520458Application Date: 2019-07-24
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Publication No.: US10943876B2Publication Date: 2021-03-09
- Inventor: Fabrice Marinet , Pascal Fornara
- Applicant: STMicroelectronics (Rousset) SAS
- Applicant Address: FR Rousset
- Assignee: STMicroelectronics (Rousset) SAS
- Current Assignee: STMicroelectronics (Rousset) SAS
- Current Assignee Address: FR Rousset
- Agency: Crowe & Dunlevy
- Priority: FR1857057 20180730
- Main IPC: H01L23/00
- IPC: H01L23/00 ; H01L23/48 ; H01L27/11521 ; G11C16/10 ; G11C16/14

Abstract:
An attack on an integrated circuit using a beam of electrically charged particles is detected by collecting charges due to the attack using at least one electrically conductive body that is electrically coupled to the floating gate of a state transistor. Prior to the attack, the state transistor is configured to confer an initial threshold voltage. The collected charges passed to the floating gate cause a modification of the threshold voltage of the state transistor. Detection of the attack is made by determining that the threshold voltage of the state transistor is different from the initial threshold voltage.
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