Invention Grant
- Patent Title: Indium solder metallurgy to control electro-migration
-
Application No.: US16328135Application Date: 2016-10-01
-
Publication No.: US10957667B2Publication Date: 2021-03-23
- Inventor: Kyu Oh Lee , Yi Li , Yueli Liu
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Schwabe, Williamson & Wyatt, P.C.
- International Application: PCT/US2016/055082 WO 20161001
- International Announcement: WO2018/063415 WO 20180405
- Main IPC: H01L23/498
- IPC: H01L23/498 ; H01L23/00 ; B23K35/24 ; C22C13/00 ; B23K35/02 ; B23K35/26

Abstract:
Embodiments are generally directed to indium solder metallurgy to control electro-migration. An embodiment of an electronic device includes a die; and a package substrate, wherein the die is bonded to the package substrate by an interconnection. The interconnection includes multiple interconnects, and wherein the interconnection includes a solder. The solder for the interconnection includes a combination of tin (Sn), copper (Cu), and indium (In).
Public/Granted literature
- US20190189582A1 INDIUM SOLDER METALLURGY TO CONTROL ELECTRO-MIGRATION Public/Granted day:2019-06-20
Information query
IPC分类: