- 专利标题: Optimization of integrated circuit reliability
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申请号: US15814658申请日: 2017-11-16
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公开(公告)号: US10989754B2公开(公告)日: 2021-04-27
- 发明人: Carole D. Graas , Nazmul Habib , Deborah M. Massey , John G. Massey , Pascal A. Nsame , Ernest Y. Wu , Emmanuel Yashchin
- 申请人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 申请人地址: US NY Armonk
- 专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人地址: US NY Armonk
- 代理机构: Roberts Calderon Safran & Cole, P.C.
- 代理商 Steven Meyers; Andrew M. Calderon
- 主分类号: G01R31/26
- IPC分类号: G01R31/26 ; G01R31/28 ; G01R31/50
摘要:
A per-chip equivalent oxide thickness (EOT) circuit sensor resides in an integrated circuit. The per-chip EOT circuit sensor determines electrical characteristics of the integrated circuit. The measured electrical characteristics include leakage current. The determined electrical characteristics are used to determine physical attributes of the integrated circuit. The physical attributes, including EOT, are used in a reliability model to predict per-chip failure rate.
公开/授权文献
- US20180074114A1 OPTIMIZATION OF INTEGRATED CIRCUIT RELIABILITY 公开/授权日:2018-03-15