Invention Grant
- Patent Title: Method of manufacturing semiconductor structure
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Application No.: US16448888Application Date: 2019-06-21
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Publication No.: US10991604B2Publication Date: 2021-04-27
- Inventor: Jyh-Shiou Hsu , Chi-Ming Yang , Tzu Jeng Hsu
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee Address: TW Hsinchu
- Agency: WPAT P.C., Intellectual Property Attorneys
- Agent Anthony King
- Main IPC: H01L21/67
- IPC: H01L21/67 ; H01L21/768 ; C25D5/34 ; C25D7/12 ; C23C28/02 ; C25D3/38 ; H01L23/532

Abstract:
A method of manufacturing a semiconductor structure includes loading the substrate from a first load lock chamber into a first processing chamber; disposing a conductive layer over the substrate in the first processing chamber; loading the substrate from the first processing chamber into the first load lock chamber; loading the substrate from the first load lock chamber into an enclosure filled with an inert gas and disposed between the first load lock chamber and a second load lock chamber; loading the substrate from the enclosure into the second load lock chamber; loading the substrate from the second load lock chamber into a second processing chamber; disposing a conductive member over the conductive layer in the second processing chamber; loading the substrate from the second processing chamber into the second load lock chamber; and loading the substrate from the second load lock chamber into a second load port.
Public/Granted literature
- US20200035524A1 METHOD OF MANUFACTURING SEMICONDUCTOR STRUCTURE Public/Granted day:2020-01-30
Information query
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