Invention Grant
- Patent Title: Etchant composition and method of fabricating integrated circuit device using the same
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Application No.: US15816699Application Date: 2017-11-17
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Publication No.: US10995269B2Publication Date: 2021-05-04
- Inventor: Jin-Woo Lee , Hoon Han , Keon-Young Kim , Jung-Hun Lim , Jin-Uk Lee , Jae-Wan Park
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Volentine, Whitt & Francos, PLLC
- Priority: KR10-2017-0064882 20170525
- Main IPC: C09K13/08
- IPC: C09K13/08 ; H01L27/1157 ; H01L21/311 ; H01L27/11582 ; C09K13/06

Abstract:
An etchant composition includes an inorganic acid, a siloxane compound, an ammonium compound, and a solvent, wherein the siloxane compound is represented by General Formula (I): A method of fabricating an integrated circuit device includes forming a structure on a substrate, the structure having a surface on which an oxide film and a nitride film are exposed; and selectively removing the nitride film from the oxide film and the nitride film by bringing the etchant composition into contact with the structure.
Public/Granted literature
- US20180142151A1 ETCHANT COMPOSITION AND METHOD OF FABRICATING INTEGRATED CIRCUIT DEVICE USING THE SAME Public/Granted day:2018-05-24
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