- 专利标题: Implementing sticky read using error control success rate associated with a memory sub-system
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申请号: US16844269申请日: 2020-04-09
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公开(公告)号: US11024394B2公开(公告)日: 2021-06-01
- 发明人: Harish Singidi , Kishore Muchherla , Ashutosh Malshe , Vamsi Rayaprolu , Sampath Ratnam , Renato Padilla, Jr. , Michael Miller
- 申请人: Micron Technology, Inc.
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: Lowenstein Sandler LLP
- 主分类号: G11C16/04
- IPC分类号: G11C16/04 ; G11C16/26 ; G11C16/34 ; G11C29/52 ; G11C7/10 ; G11C7/04 ; G11C29/42
摘要:
A memory sub-system can be determined to be operating within a target operating characteristic based on a threshold success rate associated with error control operations using a particular parameter. Upon determining that the memory sub-system is operating within the target operating characteristic, a sticky read mode is entered by performing subsequent read operations using the particular parameter. It is determined that additional error control operations are triggered for at least a first threshold number of read operations using the particular parameter during the sticky read mode. Upon determining that the additional error control operations are triggered for at least the first threshold number of read operations using the particular parameter during the sticky read mode, the sticky read mode is exited by performing further read operations using a default parameter associated with the memory sub-system.