- 专利标题: Reflective mask blank and reflective mask
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申请号: US16056765申请日: 2018-08-07
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公开(公告)号: US11036127B2公开(公告)日: 2021-06-15
- 发明人: Hirotomo Kawahara , Hiroshi Hanekawa , Toshiyuki Uno
- 申请人: AGC INC.
- 申请人地址: JP Chiyoda-ku
- 专利权人: AGC INC.
- 当前专利权人: AGC INC.
- 当前专利权人地址: JP Chiyoda-ku
- 代理机构: Oblon, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JPJP2017-156756 20170815
- 主分类号: G03F1/24
- IPC分类号: G03F1/24 ; G03F1/38 ; G03F1/40 ; G03F1/48 ; G03F1/52 ; G03F1/54
摘要:
A reflective mask blank includes a backside conductive film on a back surface of a substrate. The backside conductive film has a laminated structure including a stress compensation layer and a conductive layer in this order from the substrate side. The conductive layer includes a metal nitride. The stress compensation layer has a compressive stress and the stress compensation layer includes at least one compound selected from the group consisting of oxides, oxynitrides, and nitrides, each having an absorption coefficient (k) over the wavelength range of 400 nm to 800 nm being 0.1 or less. The conductive layer has a thickness of 5 nm or more and 30 nm or less. The backside conductive film has a total thickness of 50 nm or more.
公开/授权文献
- US20190056653A1 REFLECTIVE MASK BLANK AND REFLECTIVE MASK 公开/授权日:2019-02-21
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