- 专利标题: Method for manufacturing memory device
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申请号: US16664815申请日: 2019-10-26
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公开(公告)号: US11063213B2公开(公告)日: 2021-07-13
- 发明人: Chih-Wei Lu , Hsi-Wen Tien , Wei-Hao Liao , David Dai , Chung-Ju Lee
- 申请人: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- 申请人地址: TW Hsinchu
- 专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- 当前专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- 当前专利权人地址: TW Hsinchu
- 代理机构: Maschoff Brennan
- 主分类号: H01L47/00
- IPC分类号: H01L47/00 ; H01L43/12 ; H01L45/00 ; H01L27/22 ; H01L43/02 ; H01L27/24 ; H01L43/08
摘要:
A method includes depositing a bottom electrode layer, a resistance switching element layer, and a top electrode layer over a first dielectric layer; etching the top electrode layer and the resistance switching element layer to form a resistance switching element over the bottom electrode layer and a top electrode over the resistance switching element; depositing a metal-containing compound layer over the top electrode, the resistance switching element, and the bottom electrode layer; and etching the metal-containing compound layer and the bottom electrode layer to form a bottom electrode over the first dielectric layer.
公开/授权文献
- US20200066976A1 METHOD FOR MANUFACTURING MEMORY DEVICE 公开/授权日:2020-02-27
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