Invention Grant
- Patent Title: Method for manufacturing memory device
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Application No.: US16664815Application Date: 2019-10-26
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Publication No.: US11063213B2Publication Date: 2021-07-13
- Inventor: Chih-Wei Lu , Hsi-Wen Tien , Wei-Hao Liao , David Dai , Chung-Ju Lee
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Maschoff Brennan
- Main IPC: H01L47/00
- IPC: H01L47/00 ; H01L43/12 ; H01L45/00 ; H01L27/22 ; H01L43/02 ; H01L27/24 ; H01L43/08

Abstract:
A method includes depositing a bottom electrode layer, a resistance switching element layer, and a top electrode layer over a first dielectric layer; etching the top electrode layer and the resistance switching element layer to form a resistance switching element over the bottom electrode layer and a top electrode over the resistance switching element; depositing a metal-containing compound layer over the top electrode, the resistance switching element, and the bottom electrode layer; and etching the metal-containing compound layer and the bottom electrode layer to form a bottom electrode over the first dielectric layer.
Public/Granted literature
- US20200066976A1 METHOD FOR MANUFACTURING MEMORY DEVICE Public/Granted day:2020-02-27
Information query
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