Invention Grant
- Patent Title: On-die reliability monitor for integrated circuit
-
Application No.: US16265661Application Date: 2019-02-01
-
Publication No.: US11099232B2Publication Date: 2021-08-24
- Inventor: Suriya Ashok Kumar , Ketul B. Sutaria , Stephen M. Ramey
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Schwabe, Williamson & Wyatt, P.C.
- Main IPC: G01R31/28
- IPC: G01R31/28 ; H03K3/03 ; G01R31/00

Abstract:
Various embodiments provide a health monitor circuit including an n-type sensor to determine a first health indicator associated with n-type transistors of a circuit block and a p-type sensor to determine a second health indicator associated with p-type transistors of the circuit block. The n-type sensor and p-type sensor may be on a same die as the circuit block. The health monitor circuit may further include a control circuit to adjust one or more operating parameters, such as operating voltage and/or operating frequency, for the circuit block based on the first and second health indicators. Other embodiments may be described and claimed.
Public/Granted literature
- US20200249271A1 ON-DIE RELIABILITY MONITOR FOR INTEGRATED CIRCUIT Public/Granted day:2020-08-06
Information query