Invention Grant
- Patent Title: Automatic analyzer
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Application No.: US16331594Application Date: 2017-09-14
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Publication No.: US11143665B2Publication Date: 2021-10-12
- Inventor: Akihiro Yasui , Gorou Yoshida , Yoshiki Muramatsu , Isao Yamazaki
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Current Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JPJP2016-184267 20160921
- International Application: PCT/JP2017/033331 WO 20170914
- International Announcement: WO2018/056180 WO 20180329
- Main IPC: G01N35/02
- IPC: G01N35/02 ; G01N35/00 ; G01N35/10 ; G01N35/04

Abstract:
An automatic analyzer (100) includes: a storage unit (21b) that stores various parameters of the automatic analyzer (100) in association with each of elevations used in the automatic analyzers (100), the parameters being optimized for each of the elevations; an input unit (21d) that acquires information of an elevation at which the automatic analyzer (100) is provided; and a controller (21a) that reads the parameters stored in the storage unit (21b) and sets the read parameters to the automatic analyzer (100) based on the elevation acquired by the input unit (21d). As a result, various parameters can be easily adjusted according to a usage environment of the device.
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